Hydrogen in hydrofluorocarbon plasmas plays an important role in silicon nitride (Si 3 N 4 ) reactive ion etching. This study focuses on the elementary reactions of energetic CHF þ 2 and CH 2 F þ ions with Si 3 N 4 surfaces. In the experiments, Si 3 N 4 surfaces were irradiated by monoenergetic (500-1500 eV) beams of CHF þ 2 and CH 2 F þ ions as well as hydrogen-free CF þ 2 and CF þ ions generated by a massselected ion beam system and their etching yields and surface properties were examined. It has been found that, when etching takes place, the etching rates of Si 3 N 4 by hydrofluorocarbon ions, i.e., CHF þ 2 and CH 2 F þ , are higher than those by the corresponding fluorocarbon ions, i.e., CF þ 2 and CF þ , respectively. When carbon film deposition takes place, it has been found that hydrogen of incident hydrofluorocarbon ions tends to scavenge fluorine of the deposited film, reducing its fluorine content.