2012 IEEE 62nd Electronic Components and Technology Conference 2012
DOI: 10.1109/ectc.2012.6248918
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Measurement of die stresses in microprocessor packaging due to thermal and power cycling

Abstract: The increasingly complex packaging used in modern workstations and servers transmits a complicated set of mechanical loads to the microprocessor.

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Cited by 10 publications
(1 citation statement)
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“…1,2 Thermal effects are also as a major cause of deterioration in electronic devices. 3,4 It is quite challenging to design a packaging structure achieving good acoustic attenuation, as well as good thermal characteristics for an enclosed device. [5][6][7] An open-through rigid substructure is considered as one possible strategy to meet such specifications.…”
Section: Introductionmentioning
confidence: 99%
“…1,2 Thermal effects are also as a major cause of deterioration in electronic devices. 3,4 It is quite challenging to design a packaging structure achieving good acoustic attenuation, as well as good thermal characteristics for an enclosed device. [5][6][7] An open-through rigid substructure is considered as one possible strategy to meet such specifications.…”
Section: Introductionmentioning
confidence: 99%