Measurement of Dielectric Constant and Loss Tangent in Materials Having Large Dielectric Constants (Correspondence)

Horton, J.B.; Burdick, Glenn A.

doi:10.1109/tmtt.1968.1126805

Cited by 7 publications

(1 citation statement)

References 1 publication

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The establishment of an accurate evaluation method of dielectric characteristics with a planar circuit structure was expected to keep its physical configuration close to actual devices. The permittivity and its bias voltage dependency data are required in the designing work of voltage tunable devices [3,4]. The perturbation method, coaxial line method, waveguide method [5], parallel plate method, and free space method [6] are well known as the conventional measurement measures of dielectric characteristics.…”

Section: Introductionmentioning

confidence: 99%

Evaluation method of high‐permittivity materials in microwave region using coplanar waveguide

Tsuji

Tsuda

Nishikawa

et al. 2007

Electron Comm Jpn Pt II

View full text Add to dashboard Cite

SUMMARYThis paper proposes a novel evaluation method for dielectric characteristics of ceramic substrates made of high-permittivity material, (Ba, Sr)TiO 3 (BST), in the microwave region. The dielectric characteristics are obtained accurately and simply by measuring S-parameter and by full-wave analysis for coplanar waveguide (CPW) composed on the substrate. Only the measurement of S 21 response of the CPW is required for evaluation. The effective permittivity (ε eff ) and attenuation constant (α) are calculated from the S 21 data. Relative permittivity (ε r ) and tanδ of substrate material are estimated by relating the ε eff and α quantitatively with their simulated values calculated by the Extended Spectral Domain Approach (ESDA) taking the thickness effect of the conductor into consideration. Three kinds of BST substrates with different Ba to Sr ratios were measured as test samples. The estimated ε r 's of Ba 0.3 Sr 0.7 TiO 3 , Ba 0.5 Sr 0.5 TiO 3 , and Ba 0.7 Sr 0.3 TiO 3 were 662, 1650, and 4450, respectively. These ε r 's decrease slightly as the frequency increases. The estimated errors for the ε r 's are estimated to be less than 0.3%. This method is useful for the evaluation even of a small variation of dielectric constant in high-permittivity materials.

show abstract

Section: Introductionmentioning

confidence: 99%