Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope

Hong, Jae Won; Park, Sang-il; Khim, Z. G.

doi:10.1063/1.1149660

Cited by 107 publications

(67 citation statements)

References 14 publications

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“…The electrostatic effect originates essentially from the Coulombic electrostatic force between the 8 AFM tip/cantilever and the sample surface, [75,76] described as [77,78] .…”

Section: Fig 3 Local and Non-local Electrostatic Effects In The Afmmentioning

confidence: 99%

Non-piezoelectric effects in piezoresponse force microscopy

Seol¹,

Kim²,

Kim³

2017

Current Applied Physics

135

114

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Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantilever dynamics of an atomic force microscopy. However, several non-piezoelectric effects can induce additional contributions to the EM response, which often lead to a misinterpretation of the measured PFM response. This review aims to summarize the non-piezoelectric origins of the EM response that impair the interpretation of PFM measurements. We primarily discuss two major non-piezoelectric origins, namely, the electrostatic effect and electrochemical strain. Several approaches for differentiating the ferroelectric contribution from the EM response are also discussed. The review suggests a fundamental guideline for the proper utilization of the PFM technique, as well as for achieving a reasonable interpretation of observed PFM responses.

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“…The electrostatic effect originates essentially from the Coulombic electrostatic force between the 8 AFM tip/cantilever and the sample surface, [75,76] described as [77,78] .…”

Section: Fig 3 Local and Non-local Electrostatic Effects In The Afmmentioning

confidence: 99%

Non-piezoelectric effects in piezoresponse force microscopy

Seol¹,

Kim²,

Kim³

2017

Current Applied Physics

135

114

View full text Add to dashboard Cite

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“…The development of such probes can be roughly divided into the pre-1995 period and post-1995 period, as demarcated by the nearly simultaneous introduction of Piezoresponse Force Microscopy and (essentially similar) scanning probe microscopy methods by Kolosov and Gruverman, 41 Eng, 42 Takata, 40 Franke 43,44 and later Khim. 45 Prior to 1995, the methods for ferroelectric domain imaging were based on the then preponderant optical 46 and electron microscopy methods. [47][48][49][50] Indeed, the polarization dependence of optical and electro-optical properties of ferroelectrics enabled the broad use of optical microscopy for ferroelectric domain visualization.…”

Section: Iia Basic Pfmmentioning

confidence: 99%

Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale

Vasudevan

Balke

Maksymovych

et al. 2017

Applied Physics Reviews

270

206

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Ferroelectric materials have remained one of the foci of condensed matter physics and materials science for over 50 years. In the last 20 years, the development of voltage-modulated scanning probe microscopy techniques, exemplified by Piezoresponse force microscopy (PFM) and associated time-and voltage spectroscopies, opened a pathway to explore these materials on a single-digit nanometer level. Consequently, domain structures, walls and polarization dynamics can now be imaged in real space. More generally, PFM has allowed studying electromechanical coupling in a broad variety of materials ranging from ionics to biological systems. It can also be anticipated that the recent Nobel prize 1 in molecular electromechanical machines will result in rapid growth in interest in PFM as a method to probe their behavior on single device and device assembly levels. However, the broad introduction of PFM also resulted in a growing number of reports on nearly-ubiquitous presence of ferroelectric-like phenomena including remnant polar states and electromechanical hysteresis loops in materials which are non-ferroelectric in the bulk, or in cases where size effects are expected to suppress ferroelectricity. While in certain cases plausible physical mechanisms can be suggested, there is remarkable similarity in observed behaviors, irrespective of the materials system. In this review, we summarize the basic principles of PFM, briefly discuss the features of ferroelectric surfaces salient to PFM imaging and spectroscopy, and summarize existing reports on ferroelectric-like responses in non-classical ferroelectric materials. We further discuss possible mechanisms behind observed behaviors, and possible experimental strategies for their identification.3

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“…Tapping mode is possible at ambient temperature; however, the noncontact and intermittent modes of operation are easier in vacuum where the damping of cantilever oscillations is negligible, allowing for a much sharper resonance peak of the cantilever and hence higher sensitivity while measuring the shift in resonance frequency (Gauthier & Tsukada, 1999;Gauthier et al, 2001;Gauthier & Pérez, 2002;Giessibl, 1997, Giessibl & Bielefeldt 2000, Hong et al, 1999Jarvis et al, 2001;Martìnez & Garcia., 2006;Matsushige, 2001). Tapping mode is the most used operating mode in biology.…”

Section: Intermittent or Tapping Modementioning

confidence: 99%