1962
DOI: 10.1088/0370-1328/80/1/318
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Measurement of Ionization and Attachment Coefficients in Sulphur Hexafluoride in Uniform Fields

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Cited by 149 publications
(61 citation statements)
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“…101 However, with a hemispherical site of radius 10~2mm, there is a maximum number of 2 X 10 3 electrons produced at a distance 6-5 x 10 3 mm from the site, which are subsequently attached to negative ions within a distance of 2-5 x 10~2mm. The total number of positive ions created is 1-2 x 10~4 within a distance of 1 -5 X 10~"" 2 mm, and a similar number of negative ions is produced.…”
Section: Breakdown Caused By Electron-field Emission Alonementioning
confidence: 99%
“…101 However, with a hemispherical site of radius 10~2mm, there is a maximum number of 2 X 10 3 electrons produced at a distance 6-5 x 10 3 mm from the site, which are subsequently attached to negative ions within a distance of 2-5 x 10~2mm. The total number of positive ions created is 1-2 x 10~4 within a distance of 1 -5 X 10~"" 2 mm, and a similar number of negative ions is produced.…”
Section: Breakdown Caused By Electron-field Emission Alonementioning
confidence: 99%
“…where A is the saturation ionization in the gas at a particular E/p (electric stress/pressure) and B is related to the excitation and ionization energies [10] , [11].…”
Section: Present Approachmentioning
confidence: 99%
“…The values of A and B in equation (2) for SF 6 [9], [11] are given in Table 1. Using breakdown voltages V b from [12] and the values of A and B from Table 1, k is computed and obtained [13] as a function of pt′ as shown in Table 2.…”
Section: Present Approachmentioning
confidence: 99%
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“…Ionization (a) and attachment (n) coefficients of SF6' Experiment: X -Geballe and Harrison [16],0 -Bhalla and Craggs [17],\1-McAfee and Edelson [18], 6. - Maller and Naidu [19 J , (P20; 1 torr).…”
Section: Evaluation Of the Cross Sectionsmentioning
confidence: 99%