2013
DOI: 10.1016/j.nimb.2013.08.045
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Measurement of L X-ray production cross sections by impact of proton beams on Hf, Ir, and Tl

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Cited by 16 publications
(4 citation statements)
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“…The database used in this work relies mainly on the recent compilations of Miranda and Lapicki . In addition to this, we selected an additional number of data from other works . These experimental data are not reported in the paper of Miranda and Lapicki .…”
Section: Semi‐empirical Formulaementioning
confidence: 99%
“…The database used in this work relies mainly on the recent compilations of Miranda and Lapicki . In addition to this, we selected an additional number of data from other works . These experimental data are not reported in the paper of Miranda and Lapicki .…”
Section: Semi‐empirical Formulaementioning
confidence: 99%
“…The measurement of emitted x-rays from targets has resulted in major advances in radiation physics [1], plasma physics [2], atomic and nuclear physics [3], and the particle-induced x-ray emission (PIXE) technique [4,5]. Thus far, the PIXE method has used light ions such as protons or alphas [6][7][8][9][10][11][12][13]; however, there is an increasing interest to employ heavy ions since their cross sections are larger and have, thereby, better sensitivity [14]. Nevertheless, this potentiality is discouraged by discrepancies observed between the theories and experiments.…”
Section: Introductionmentioning
confidence: 99%
“…e detailed knowledge of X-ray emission provides important information to understand the charged ion-atom interaction mechanism and to test relevant ionization theories [1][2][3][4]. Furthermore, accurate parameters of X-ray are required for the application of trace element analysis known as particle-induced X-ray emission (PIXE), which has application in many fields, such as environmental studies, archaeology, biomedicine, and forensic science [5][6][7][8].…”
Section: Introductionmentioning
confidence: 99%