Measurement of magnetic near field on a coplanar waveguide using a MFM tip

Abstract

This paper proposes a method to measure the ac magnetic field distribution in close proximity to a coplanar waveguide (CPW) employing a cantilever tip fabricated for magnetic force microscopy as a sensor. Almost the entire surface of the tip is coated with a magnetically hard film (Co–Cr–Pt), which is magnetized vertically. Herein we focus on the accuracy of the tip image distribution in close proximity of the ac fields from downsized CPWs which, for example, have a signal line as fine as 5 μm and ground lines of 50 μm. The results suggest that the system has potential as a micron scale RF field detector, although a few technological problems must be solved.

Effect of Zr and Nb additions on the high-frequency magnetic properties of Co85-(x+y)Zr3+xNb12+y films

“…The signal line, gap, and ground line widths were 5, 6, and 50 lm, respectively, which provided a characteristic impedance (Z 0 ) of 44.9 X. 11,12 The concentration of the Co 85-(xþy) Zr 3þx Nb 12þy films was evaluated by energy dispersive x-ray spectroscopy (EDX) ( Table I), while transmission electron microscopy (TEM) was employed to characterize the crystallographic structure of the Co 85-(xþy) Zr 3þx Nb 12þy films. As for the magnetic properties of the Co 85-(xþy) Zr 3þx Nb 12þy films, the a)…”

Temperature and microwave near field imaging by thermo-elastic optical indicator microscopy

“…Various approaches have been proposed based on different kinds of physical phenomena45678910111213. They often rely on scanning probe techniques with carefully designed scanning probes, particular materials and physical processes.…”