Measurement of mobility in nanocrystalline semiconductor materials using space charge limited current

Stieler, Daniel

doi:10.31274/rtd-20201107-487

DOI: 10.31274/rtd-20201107-487

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Measurement of mobility in nanocrystalline semiconductor materials using space charge limited current

Daniel Stieler¹

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(aSiGe/ncSi) Superlattice thin film silicon solar cell

Chakravarty

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CHAPTER 1. INTRODUCTION CHAPTER 2. GROWTH OF NANOCRYSTALLINE SILICON 2.1 Growth Mechanisms ix ACKNOWLEDGMENT I would like to show my gratitude and thank to those who helped me with various aspects of conducting research and the writing of this thesis. First and foremost, I would like to thank my major professor Dr.Vikram L. Dalal for his constant support and faith in me for the last four years. He has been always a support pillar and helped me in every possible way during my research. I would also like to thank my committee members for their invaluable

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(aSiGe/ncSi) Superlattice thin film silicon solar cell

Chakravarty

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Measurement of mobility in nanocrystalline semiconductor materials using space charge limited current

Cited by 1 publication

References 11 publications

(aSiGe/ncSi) Superlattice thin film silicon solar cell

(aSiGe/ncSi) Superlattice thin film silicon solar cell

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