Measurement of Parameters of Analog-to-Digital Converters Based on the NI Hardware-Software Complex in the Course of a Radiation Experiment

Torshin, Roman; Sorokoumov, Georgy S.; Bobrovsky, Dmitry V.; Titovets, Dmitry O.; Kalashnikova, M.O.

doi:10.1109/sibcon50419.2021.9438886

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Measurement of Parameters of Analog-to-Digital Converters Based on the NI Hardware-Software Complex in the Course of a Radiation Experiment

Cited by 3 publications

References 8 publications

Probabilistic Approach to Determining the Transient Upset Level of Digital Integrated Circuits

Probabilistic Approach to Determining the Transient Upset Level of Digital Integrated Circuits

Total Ionizing Dose Effects in High-Speed 16-bit Analog-to-Digital Converter

Design of TID-Tolerant ADCs in Multivoltage Domain Based on Body Effect

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