Measurement of polarization and applications

Abstract

We present a polarization measuring system which is capable to determine the complete Stokes vector of radiation with a wavelength from deep ultraviolet (i.e. 190 nm) to the visible spectral range. Due to a special design the entire wavelength range is covered by one single device (i.e. no exchange of optical components is necessary). In addition the system is able to determine the Jones and the Mueller matrices of lenses, waveplates and other samples automatically and spatially resolved within the same wavelength region. The system consists of a polarization state generator and a polarization sensitive detector consisting of a rotating waveplate, a polarizer, and a detector. A fast Fourier algorithm provides the four Stokes parameters of the light where all parameters are calculated independently. By tuning the polarization of the illuminating light we calculate the Jones matrix and the birefringence of the sample. Under industrial conditions we found an accuracy of the stress birefringence of 0.1 nm and an accuracy of the azimuth of the fast axis of 0.1 O . Because polarization is a very important property of radiation, the system has a lot of applications. Examples are the testing of optical elements like waveplates, polarizers and lens system.

Determination of the electromagnetic wave polarization from unknown sources by the method of linear component modified

“…The polarization of an EM wave can be totally determinated when the amplitude and the phase of its electric field are known [5][6][7]. However, the techniques employed in commercial equipments for phase determination require the use of a setup composed of several equipments which have a low mobility, even for measurements performed in the far field region [8].…”

Completely polarized electromagnetic wave measurement by linear component method

“…The determination of the polarization of an EM wave can be straightforwardly accomplished when the amplitude and the phase of its electric field are available, i.e. when the polarization pattern is known [5][6][7]. However, the techniques employed in commercial systems for phase determination require the use of a setup composed of several equipments which has low mobility, even for measurements performed in the far-field region [8].This paper proposes a refinement in the linear component method for measuring the polarization of EM waves in the far-field region, using a simple but efficient setup.…”

Polarization extraction through the linear component method

“…The knowledge of the electric field amplitude and phase [3], allows us to identify the pattern of a polarized wave. Using the techniques of measuring the polarization, [4] and [5], we can find the unknown polarization of one or more sources.…”