Measurement of SEU Thresholds and Cross Sections at Fixed Incidence Angles

Bevalac ion beam characterizations for single event phenomena

“…Also, the cross section of 93LA22 given in [2] agrees well with our own measurements conducted at the LBL 88-inch cyclotron facility [6]. )…”

“…The authors of this paper used the phrase "ion species dependence" to describe this phenomenon. A 1987 article, continuing the work begun in [1], described additional studies at Bevalac using both 27LS00 and 93L422 (bipolar 256x4 SRAM) as test devices [2]. As before, a water column degrader was used at the Biomed site.…”

“…The Lawrence Berkeley Laboratory (LBL) Bevalac has been used to characterize the susceptibility of microcircuits to ions in space [1][2][3][4]. This susceptibility is usually measured in terms of such phenomena as single-event latchup (SEL), single-event upset (SEU), and single-event burnout (SEB).…”

Intermediate energy heavy ions: An emerging multidisciplinary research tool

“…Intermediate Energy Heavy IonS 7 Alonso components in these beams to assess their vulnerability to impact by a highly ionizing heavy cosmic ray [20].…”

Shortcomings in ground testing, environment simulations, and performance predictions for space applications

“…This allowed a curve of error cross-section to be developed easily by the use of only one ion specie in some cases. However, as the testing became more sophisticated and knowledge accumulated, experimental results (10,11,12) showed that the use of an equivalent LET given by "LET x secant O," was only valid in some cases. In addition, the ionization charge in the distribution around an ion's track in silicon may influence the experimental SEU sensitivity of a device.…”