2011 16th International Solid-State Sensors, Actuators and Microsystems Conference 2011
DOI: 10.1109/transducers.2011.5969785
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Measurement of shear stress between single-wall carbon nanotubes and substrates using NEMS devices

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Cited by 3 publications
(2 citation statements)
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“…The entire nanomanipulation process is conducted inside the SEM, as discussed in [13,14]. After the nanomanipulation, the SWNT bundle is checked in the SEM and images of the bundle at two different angles (90°apart) are taken.…”
Section: Test Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The entire nanomanipulation process is conducted inside the SEM, as discussed in [13,14]. After the nanomanipulation, the SWNT bundle is checked in the SEM and images of the bundle at two different angles (90°apart) are taken.…”
Section: Test Methodsmentioning
confidence: 99%
“…In our previous work, a new technique based on simple NEMS cantilever beams, a nanomanipulator, and a SEM, along with a theoretical model was developed to study the interfacial shear stress between SWNTs and gold surfaces with and without alkanethiols [13,14]. These results show that we can vary the shear stress by a factor of 20 by functionalizing a gold surface with different alkanethiols.…”
Section: Introductionmentioning
confidence: 99%