Measurement of single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π

Abstract

This article presents measurements of the piezoelectric modulus d 11 of a single crystal of lanthanum gallium silicate (LGS, La 3 Ga 5 SiO 14 ). The piezoelectric modulus was measured by X-ray diffraction at angles close to backscattering. Experiments in such schemes are very sensitive to relative changes in the lattice constant in crystals caused by external influences (constant or alternating electric field, mechanical load, temperature change etc.). The development opportunity of the technique is shown, its applicability is evaluated and results of measurement of the LGS single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near are discussed.

Local variations of the piezoelectric properties of an LiNb(1−x)Ta x O3 crystal

“…2) is described by Gureva et al (2022). Application of the diffraction method at angles close to 180 has shown high sensitivity to changes in the crystal structure under the influence of an external electric field (Gureva et al, 2020).…”

“…Recently, the use of XRD at Bragg angles close to 90 has been proposed for determining piezoelectric coefficients, which allows one to add to the spatial locality of piezoelectric property magnitude measurement a better accuracy due to the high sensitivity to the relative variations in the lattice parameter up to 10 À6 -10 À7 (Gureva et al, 2020(Gureva et al, , 2022.…”