Measurement of subpicosecond electron pulse length

Abstract

Abstract.A new frequency-resolved bunch-length measuring system has been developed at the Stanford SUNSHINE facility to characterize subpicosecond electron pulses. Using a far-infrared Michelson interferometer, this method measures the spectrum of coherent transition radiation emitted from electron bunches through optical autocorrelation. The electron bunch length is obtained from the measurement with a simple and systematic analysis which includes interference effects caused by the beam splitter. This method demonstrates subpicosecond resolving power that cannot be achieved by existing time-resolved methods. The principle of this method and experimental results are discussed.

Measurement of subpicosecond bunch profiles using coherent transition radiation

“…(27) represents the autocorrelation of the beam current, which in turn is proportional to the autocorrelation of the bunch profile repeated periodically with period T. Thus by measuring power as the movable mirror is moved, over a distance equal to the bunch length, the longitudinal bunch profile is obtained. The resolution of this technique, for large foils, is limited only by the dispersive properties of the interferometer and the response of the power detector as discussed in (5). The effect of finite foil dimensions on resolution is discussed in the next section.…”

“…In addition, a noninterceptive technique for measuring bunch profile with coherent diffraction radiation is outlined (4). A companion paper (5) in this proceedings addresses experimental results of the coherent transition radiation bunch length measurement technique.…”