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Oswald, C.; Urquijo, P.; Dingfelder, J.; Adachi, I.; Aihara, H.; Arinstein, K.; Asner, D. M.; Aushev, T.; Bakich, A. M.; Belous, K.; Bhardwaj, V.; Bhuyan, B.; Bondar, A.; Bonvicini, G.; Bożek, A.; Bračko, M.; Browder, T. E.; Chang, P.; Chekelian, V.; Chen, A.; Chen, P.; Cheon, B. G.; Chilikin, K.; Chistov, R.; Cho, K.; Chobanova, V.; Choi, S. K.; Choi, Y.; Cinabro, D.; Dalseno, J.; Doležal, Z.; Drásal, Z.; Drutskoy, A.; Dutta, D.; Eidelman, S.; Esen, S.; Farhat, H.; Fast, J. E.; Gaur, V.; Gabyshev, N.; Ganguly, S.; Gillard, R.; Goh, Y. M.; Golob, B.; Haba, J.; Hayasaka, K.; Hayashii, H.; Horii, Y.; Hoshi, Y.; Hou, W.-S.; Hyun, H. J.; Iijima, T.; Ishikawa, A.; Itoh, R.; Iwasaki, M.; Kah, D. H.; Kang, J. H.; Kato, E.; Kawasaki, T.; Kiesling, C.; Kim, H. J.; Kim, H. O.; Kim, J. B.; Kim, K. T.; Kim, M. J.; Kim, Y. J.; Kinoshita, K.; Klucar, J.; Ko, B. R.; Korpar, S.; Kouzes, Richard T.; Križan, P.; Krokovny, P.; Kronenbitter, B.; Kuhr, T.; Kumita, T.; Kwon, Y.; Lee, Soohyung; Li, J.; Li, Y.; Libby, J.; Liu, C.; Liu, Y.; Liu, Z. Q.; Liventsev, D.; Louvot, R.; Lutz, O.; Matvienko, D.; Miyabayashi, K.; Miyata, H.; Mizuk, R.; Mohanty, G. B.; Moll, A.; Muramatsu, N.; Nagasaka, Y.; Nakano, E.; Nakao, M.; Nedelkovska, E.; Nisar, N. K.; Nishida, S.; Nitoh, O.; Nozaki, T.; Ogawa, S.; Ohshima, T.; Okuno, S.; Olsen, S. L.; Ostrowicz, W.; Pakhlov, P.; Pakhlova, G.; Park, H.; Park, H. K.; Pedlar, T. K.; Pestotnik, R.; Petrič, M.; Piilonen, L. E.; Prim, M.; Prothmann, K.; Ritter, M.; Röhrken, M.; Różańska, M.; Ryu, S.; Sahoo, H.; Saito, T.; Sakai, Y.; Sandilya, S.; Šantelj, L.; Sanuki, T.; Sato, Y.; Schneider, O.; Schnell, G.; Schwanda, C.; Schwartz, A. J.; Senyo, K.; Seon, O.; Sevior, M. E.; Shapkin, M.; Shen, C. P.; Shibata, T. A.; Shiu, J. G.; Shwartz, B.; Sibidanov, A.; Simon, F.; Smerkol, P.; Sohn, Y. S.; Sokolov, A.; Solovieva, E.; Starič, M.; Sumiyoshi, T.; Tatishvili, G.; Teramoto, Y.; Trabelsi, K.; Tsuboyama, T.; Uchida, M.; Uehara, S.; Uglov, T.; Unno, Y.; Uno, S.; Hulse, C. Van; Vanhoefer, P.; Varner, G.; Varvell, K. E.; Wang, C. H.; Wang, M. Z.; Wang, P.; Watanabe, M.; Watanabe, Y.; Williams, K. M.; Won, E.; Yamamoto, H.; Yamashita, Y.; Zhang, C. C.; Zhang, Z. P.; Zhilich, V.; Zupanc, A.

doi:10.1103/physrevd.87.072008

Cited by 10 publications

(2 citation statements)

References 28 publications

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“…A further related observable is the semi-leptonic branching ratio. Its standard model value reads [115] Br where the first two values are taken from the PDG [42] and the value for B s is from [132]. These numbers agree well with the theory prediction, which will be probably affected notably by the inclusion of NNLO-QCD effects.…”

Section: 39)supporting

confidence: 68%

Selected topics in heavy flavour physics

Lenz¹

2014

J. Phys. G: Nucl. Part. Phys.

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We review the status of flavour physics in spring 2014. The numerous accurate new measurements of flavour experiments have enabled us to test our theoretical understanding of flavour processes with an unprecedented precision. At first sight the dominant amount of measurements seems to be standard model like. Having a closer look one finds, however, that in most of the observables there is still some considerable space for new effects. In addition many discrepancies are still not settled yet. For further investigations and definite conclusions an improvement of the theoretical precision as well as the experimental one is mandatory.

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Section: 39)supporting

confidence: 68%

Selected topics in heavy flavour physics

Lenz¹

2014

J. Phys. G: Nucl. Part. Phys.

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“…[32] The Belle collaboration profited from their large Υ(5S) data sample to perform the most precise measurement of the B s → Xℓν branching fraction. [33] This decay mode has a large event yield due to the large expected branching fraction (∼ 10% for each flavor, e and µ), and as only the charged lepton is reconstructed, it can be detected with high efficiency. Consequently, it was feasible to tag B sBs pair events by reconstruction of D + s mesons from the Cabibbo-favored decay modeB s → D ± s X, which has a large probability of (93 ± 25)%.…”

Section: Semileptonic Decaysmentioning

confidence: 99%