2011
DOI: 10.1364/josab.28.000199
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Measurement of the infrared complex Faraday angle in semiconductors and insulators

Abstract: We measure the infrared (wavelength λ = 11 -0.8 μm; energy E = 0.1 -1.5 eV) Faraday rotation and ellipticity in GaAs, BaF 2 , LaSrGaO 4 , LaSrAlO 4 , and ZnSe. Since these materials are commonly used as substrates and windows in infrared magneto-optical measurements, it is important to measure their Faraday signals for background subtraction. These measurement also provide a rigorous test of the accuracy and sensitivity of our unique magneto-polarimetry system. The light sources used in these measurements cons… Show more

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Cited by 16 publications
(9 citation statements)
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“…In order to measure the rotation and ellipticity angles θ and ψ in a broad energy range we developed a sensitive experimental technique which is described in detail in [18]. We use a Xe lamp (0.33-2.7 eV) with a double prism CaF 2 monochromator and discrete spectral lines from CO 2 (115-133 meV) and CO (215-232 meV) lasers [33]. Measurements are done in the reflection geometry close to normal incidence (≈6…”
Section: Methodsmentioning
confidence: 99%
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“…In order to measure the rotation and ellipticity angles θ and ψ in a broad energy range we developed a sensitive experimental technique which is described in detail in [18]. We use a Xe lamp (0.33-2.7 eV) with a double prism CaF 2 monochromator and discrete spectral lines from CO 2 (115-133 meV) and CO (215-232 meV) lasers [33]. Measurements are done in the reflection geometry close to normal incidence (≈6…”
Section: Methodsmentioning
confidence: 99%
“…We use a Xe lamp (0.33-2.7 eV) with a double prism CaF 2 monochromator and discrete spectral lines from CO 2 (115-133 meV) and CO (215-232 meV) lasers. 30 Measurements are done in the reflection geometry close to normal incidence (≈ 6 • with respect to the sample normal) whereas we assume that the polarization plane rotation due to the longitudinal Kerr effect is negligible. The samples are mounted on a custom made rotating sample holder attached to the cold finger which is cooled down to 15 K. The holder enables a precise rotation of the sample, and thus of the magnetization with respect to the incident polarization using external magnetic field B, which is applied along a fixed in-plane direction.…”
Section: Methodsmentioning
confidence: 99%
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“…The MLD is measured using discrete spectral lines from CO 2 (115 -133 meV), CO (215 -232 meV) and Ti-sapphire (1.63 eV) lasers and two distinct broadband light sources: a halogen lamp with a diffraction grating monochromator (Jobin Yvon Spex Model HR250) and the Xe lamp (Perkin-Elmer Cermax) with a double-pass CaF 2 prism monochromator (Perkin-Elmer Model 99). 28 The main advantage of the prism monochromator is that each wavelength is dispersed into a unique angle, which is not the case for the diffraction grating monochromator where a cut-off filter is used to remove the higher order diffraction peaks. Unlike typical arc lamps, which are housed in glass (limiting their usage to below 2.5 µm), our Xe lamp is equipped with a sapphire window that enables access to longer wavelengths.…”
Section: Methodsmentioning
confidence: 99%
“…This MIR light is directed onto the sample at near normal incidence, and the reflected beam polarization is analyzed using a combination of photoelastic modulation and lock-in techniques that allow for the simultaneous determination of the complex Kerr angle and the magneto-reflectivity35464748. The probing beam at the sample is on the order of hundreds of microns in diameter and therefore our measurements probe a mixture of response from all forms of graphene present in the laser spot.…”
Section: Methodsmentioning
confidence: 99%