Measurement of the lattice parameter of a silicon crystal

Massa, Enrico; Mana, Giovanni; Kuetgens, U.; Ferroglio, Luca

doi:10.1088/1367-2630/11/5/053013

Cited by 55 publications

(50 citation statements)

References 18 publications

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“…The WASO04 crystal was grown and purified by application of the float-zone technique by Wacker Siltronic in January 1995. It was doped with nitrogen to prevent precipitation of vacancies and self-interstitials; detailed information about the crystal characterization can be found in [8,11]. The homogeneity of its lattice parameter was investigated by the PTB and NIST [12,13].…”

Section: Lattice Parameter Of the Waso04 Crystalmentioning

confidence: 99%

The lattice parameter of the²⁸Si spheres in the determination of the Avogadro constant

et al. 2011

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Section: Lattice Parameter Of the Waso04 Crystalmentioning

confidence: 99%

The lattice parameter of the²⁸Si spheres in the determination of the Avogadro constant

et al. 2011

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“…The surface damage produced by grinding was removed by a variant of the well known cupric ion process used for polishing Si wafers. Detailed information about the crystal characterization is given by Massa, Mana, Kuetgens et al (2009).…”

Section: Experimental Apparatusmentioning

confidence: 99%

Calibration of a silicon crystal for absolute nuclear spectroscopy

et al. 2010

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To tie the wavelengths of γ‐rays to a visible standard is a key element of accurate determinations of the Planck constant and of tests of the Einstein mass–energy equivalence. This link is achieved via small diffraction angle measurements and perfect single crystals, the lattice parameter of which is determined by combined X‐ray and optical interferometry. The present paper concerns the lattice parameter measurement of an Si crystal, of a natural isotopic composition, designed to be used both as the analyser crystal of an X‐ray interferometer and the reference grating of a γ‐ray spectrometer.

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“…Two Xray/optical interferometers specimens were cut from the 87 cm position of the ingot, and absolute lattice spacing measurements were performed at INRIM using a significantly improved apparatus. The displacement of the movable crystal was extended to 5 cm with nanoradian alignment and nanometer straightness [32,33]. The results from the two interferometers were in excellent agreement, with a relative uncertainty of 5 × 10 −9 , which is nearly an order of magnitude more accurate than earlier lattice parameter measurements.…”

Section: Standard Crystalsmentioning

confidence: 70%

“…W04 d220 = 192.015 570 2(10) × 10 −12 m at 22.5 °C and 0 Pa (vacuum) [4,32,33]. The X-ray/optical interferometer measurements were performed near 22.5 °C and at 0 Pa. Corrections to account for small deviation from 22.5 °C are described later in this section.…”

Section: Standard Crystalsmentioning

confidence: 99%

The Lattice Spacing Variability of Intrinsic Float-Zone Silicon

Kessler¹,

Szabo²,

Cline³

et al. 2017

J. RES. NATL. INST. STAN.

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Precision lattice spacing comparison measurements at the National Institute of Standards and Technology (NIST) provide traceability of X-ray wavelength and powder diffraction standards to the international system of units (SI). Here, we both summarize and document key measurements from the last two decades on six lots of intrinsic float-zone silicon, including unpublished results and recent internal-consistency checks. The comparison measurements link the unknown lattice spacing of a test crystal to a standard crystal for which the lattice spacing has been accurately determined by X-ray/optical interferometry in units traceable to the definition of the meter. The crystal that serves as the standard in all the comparisons is WASO 04, for which the lattice spacing is known with a relative uncertainty of 5 × 10 ; taking material variability into account, measurements yield relative uncertainties for the test materials of a few tens of nanometers. It is observed that in the case of nearly perfect modern intrinsic float-zone silicon, the variability of the lattice spacing is sufficiently small that for most diffraction applications, a recommended reference value may be used.

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Measurement of the lattice parameter of a silicon crystal

Cited by 55 publications

References 18 publications

The lattice parameter of the²⁸Si spheres in the determination of the Avogadro constant

The lattice parameter of the²⁸Si spheres in the determination of the Avogadro constant

Calibration of a silicon crystal for absolute nuclear spectroscopy

The Lattice Spacing Variability of Intrinsic Float-Zone Silicon

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Measurement of the lattice parameter of a silicon crystal

Cited by 55 publications

References 18 publications

The lattice parameter of the28Si spheres in the determination of the Avogadro constant

The lattice parameter of the28Si spheres in the determination of the Avogadro constant

Calibration of a silicon crystal for absolute nuclear spectroscopy

The Lattice Spacing Variability of Intrinsic Float-Zone Silicon

Contact Info

Product

Resources

About

The lattice parameter of the²⁸Si spheres in the determination of the Avogadro constant

The lattice parameter of the²⁸Si spheres in the determination of the Avogadro constant