2010
DOI: 10.1051/epjconf/20100503001
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Measurement of the optical activity of anisotropic samples by transmission Mueller matrix ellipsometry

Abstract: Abstract. In this work we review some of the approaches we have developed to study the optical activity in anisotropic samples. They all are based in the spectroscopic measurement of the normalized Mueller matrices of the samples.

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Cited by 12 publications
(16 citation statements)
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“…The Dual-PEM Mueller matrix polarimeter instrument and the data analysis were essentially the same as those reported previously [ 18 ]. The instrument used to measure the Mueller matrices of CLM cell system is a two-modulator generalized ellipsometer (2-MGE) [ 19 , 20 ].…”
Section: Methodsmentioning
confidence: 99%
“…The Dual-PEM Mueller matrix polarimeter instrument and the data analysis were essentially the same as those reported previously [ 18 ]. The instrument used to measure the Mueller matrices of CLM cell system is a two-modulator generalized ellipsometer (2-MGE) [ 19 , 20 ].…”
Section: Methodsmentioning
confidence: 99%
“…The corresponding treatment was exact in the sense that the full dielectric tensor function was obtained, but simplified by the assumption of normal incidence, a condition that is naturally not fulfilled in Variable Angle Spectroscopic ellipsometry. While it took until 2010 before corresponding analytic formula for non‐normal incidence were derived, progress was nevertheless made, e. g. concerning obtaining the principal dielectric components, and the separation of the influence of linear and circular birefringence and dichroism . The first exact quantitative analysis of monoclinic crystals under non‐normal light incidence was then performed nearly simultaneously with NIR‐VIS‐UV ellipsometry and IR reflectance spectroscopy in 2011 and 2012 ,.…”
Section: Introductionmentioning
confidence: 99%
“…While it took until 2010 before corresponding analytic formula for non-normal incidence were derived, [13] progress was nevertheless made, e. g. concerning obtaining the principal dielectric components [14,15] and the separation of the influence of linear and circular birefringence and dichroism. [16] The first exact quantitative analysis of monoclinic crystals under non-normal light incidence was then performed nearly simultaneously with NIR-VIS-UV ellipsometry and IR reflectance spectroscopy in 2011 and 2012. [17,18] The later immediately followed the first quantitative analysis of triclinic crystals in 2013.…”
Section: Introductionmentioning
confidence: 99%
“…For instance, numerous works have been mostly dedicated to characterizing material media (thin film, dielectric materials, metasurfaces, etc. ), converting experimental polarimeters into ellipsometers [ 8 , 9 , 10 ]. Advances in the remote sensing research field have allowed Mueller polarimeters to focus on the target detection of micro-/nano-particles in a turbid or highly scattering medium [ 11 , 12 , 13 , 14 , 15 ].…”
Section: Introductionmentioning
confidence: 99%