2013
DOI: 10.1088/1674-1137/37/7/078202
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Measurement of the spatial resolution and the relative density resolution in an industrial cone-beam micro computed tomography system

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Cited by 3 publications
(1 citation statement)
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“…Slits measurement [5,6] is a simple sample preparation and is a high accuracy method, but requires a good parallelization of the slits and the pixel array of FPD. Steps measurement [7][8][9] has the differential operator in the calculation from the edge spread function to line spread function, which makes it very sensitive to noises, and the calculated modulation transfer function will be lower than the result of the slits measurement. Pinhole measurement [10,11] is widely used for focal spot diagnostics and PSF measurement in various ray sources, but the ideal pinhole imaging in actual systems is difficult to obtain.…”
Section: Introductionmentioning
confidence: 99%
“…Slits measurement [5,6] is a simple sample preparation and is a high accuracy method, but requires a good parallelization of the slits and the pixel array of FPD. Steps measurement [7][8][9] has the differential operator in the calculation from the edge spread function to line spread function, which makes it very sensitive to noises, and the calculated modulation transfer function will be lower than the result of the slits measurement. Pinhole measurement [10,11] is widely used for focal spot diagnostics and PSF measurement in various ray sources, but the ideal pinhole imaging in actual systems is difficult to obtain.…”
Section: Introductionmentioning
confidence: 99%