2005
DOI: 10.1002/pssc.200461127
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Measurement of the third order nonlinear properties of conjugated polymers embedded in porous silicon and silica

Abstract: oral session 7 " Optical Phenomena & devices " [O-33]International audienceThird order nonlinear properties of new composite materials obtained by embedding conjugate polymers in porous silicon and silica matrices are measured in near infrared. A new technique so-called "I-scan" was used as alternative to the classical z-scan, since better adapted to the particular form of samples. The picoseconds measurements show a significant increase of the nonlinear refractive index not only with respect to the standard o… Show more

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Cited by 13 publications
(8 citation statements)
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“…In I-scan measurements the light intensity is controlled in broad limits by means of optical attenuator, whereas the laser-beam cross section has no variation. [85][86][87][88]…”
Section: Light Self-action In Porous Siliconmentioning
confidence: 99%
“…In I-scan measurements the light intensity is controlled in broad limits by means of optical attenuator, whereas the laser-beam cross section has no variation. [85][86][87][88]…”
Section: Light Self-action In Porous Siliconmentioning
confidence: 99%
“…2. The nonlinear refractive index in the composite material was found to be n 2 = 2.7 10 -15 m²/W indicating a self-focusing nonlinearity, about three orders of magnitude stronger than the one of CS 2 [8]. Open aperture transmission measurements show a saturable absorber behavior.…”
Section: Poly(3-dodecylthiophene)-porous Silicon Compositementioning
confidence: 88%
“…For the measurement of the third order nonlinearity we used the same technique as described above. Close aperture I-scan measurement gave for the nonlinear refractive index n 2 = 3.8 10 -15 m²/W thus indicating a focusing nonlinearity which is about three orders of magnitude larger than the well known reference CS 2 [8]. Measurements of the nonlinear refractive index of free standing films of PDA-TS for the aim of comparison are actually in progress.…”
Section: Pda-ts-oxidized Porous Silicon Nanocompositementioning
confidence: 97%
“…The rise in temperature of the medium is accompanied by a change in its refractive index ( n = (dn/dT ) T ), which alters the propagation of the probe beam. From equation 1it is possible evaluate the dependence between TLS and E in an experiment called Iscan [5,6]. The data provided in this experiment can be linearly fitted in order to obtain the slope, ζ defined by:…”
Section: Introductionmentioning
confidence: 99%