2008
DOI: 10.1007/s11510-008-0010-6
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Measurement of the wave characteristics of a film under the effect of external perturbations

Abstract: The effect of artificial perturbations on structure formation in the water film flow over a vertical plate with a heater was studied experimentally. To measure the film thickness an eight-channel capacitance probe was used. It is shown that artificial perturbations on the liquid film surface can change the distance between rivulets from the values corresponding to the thermocapillary-wave regime of rivulet formation to the values related to the thermocapillary regime. The distance between the rivulets can be c… Show more

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