2019 42nd International Spring Seminar on Electronics Technology (ISSE) 2019
DOI: 10.1109/isse.2019.8810149
|View full text |Cite
|
Sign up to set email alerts
|

Measurement of Thermal Properties and Interface Thermal Resistance of Thin Films by Thermoreflectance

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 10 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?