Measurement of thermophysical properties of hydrogenated amorphous carbon thin films using picosecond thermoreflectance technique

Measurement of High-temperature Thermophysical Properties of Bulk and Coatings Using Modulated Photothermal Radiometry

“…Thermal transport at high temperatures is a significant process for many applications [1], such as concentrated solar power (CSP) plants [2,3], thermal energy storage [4], and thermal barrier coatings for gas-turbine engines [5]. There are several established techniques for high temperature thermal conductivity measurement, such as the laser flash analysis (LFA) [6,7], transient hot-wire (THW) [8], hot-disk transient plane-source (TPS) [9,10], 3ω method [11][12][13], as well as the pump-probe time or frequency domain thermoreflectance (TDTR/FDTR) techniques [14][15][16][17], etc. However, there are still limitations of these techniques under certain circumstances, for example, on samples with rough surfaces and at high temperature.…”

Scanning thermal microscopy techniques for polymeric thin films using temperature contrast mode to measure thermal diffusivity and a novel approach in conductivity contrast mode to the mapping of thermally conductive particles

“…The thermal diffusivities of metallic thin films of approximately 100 nm thickness were measured. Work established by Paddock and Eesley and extended by Cahill [13] continues to inform current research such as that by Alwi [14] on nonmetal amorphous carbon thin films and by Liu et al [15] on the measurement of the thermal properties of polystyrene thin films of thickness 310 nm and below.…”

Perturbation theories behind thermal mode spectroscopy for high-accuracy measurement of thermal diffusivity of solids

“…As a result, the parameter a 1 , including in Eq. (19), must be the most important dimensionless variable to quantify the effects of temperature-dependent thermal diffusivity. This is numerically confirmed in Appendix B.…”

“…Frazier 8 measured the temperature decay rate of the slowest decaying mode (SDM) excited in a rod to obtain the thermal diffusivity of nickel with an appropriate selection of measurement points so that the second slowest mode could be eliminated. Alwi et al 19 applied TDTR to measure the decay rate of the SDM induced by the heating on the front surface. All the cases measure the decay rate of the SDM in one-dimensional (axisymmetric or pointwise symmetric) heat conduction phenomena.…”