2000
DOI: 10.1016/s0022-3697(99)00412-6
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Measurement of Young's modulus of nanocrystalline ferrites with spinel structures by atomic force acoustic microscopy

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Cited by 84 publications
(55 citation statements)
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“…[4] Recent studies have shown that it is possible to make measurements of dynamic Young's modulus at nanometer resolution on various materials using Atomic Force Acoustic Microscopy (AFAM) [Kester et al, 2000;Rabe et al, 2001;Amelio et al, 2001]. We have investigated the feasibility of such measurements on clay minerals.…”
Section: Introductionmentioning
confidence: 99%
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“…[4] Recent studies have shown that it is possible to make measurements of dynamic Young's modulus at nanometer resolution on various materials using Atomic Force Acoustic Microscopy (AFAM) [Kester et al, 2000;Rabe et al, 2001;Amelio et al, 2001]. We have investigated the feasibility of such measurements on clay minerals.…”
Section: Introductionmentioning
confidence: 99%
“…However, elastic properties of clay minerals are almost unknown [Alexandrov and Ryzhova, 1961]. Until now, estimates of single crystal elastic properties have been either theoretical [Katahara, 1996], or based on extrapolations from measurements on clay-epoxy mixtures [Wang et al, 2001].[4] Recent studies have shown that it is possible to make measurements of dynamic Young's modulus at nanometer resolution on various materials using Atomic Force Acoustic Microscopy (AFAM) [Kester et al, 2000;Rabe et al, 2001;Amelio et al, 2001]. We have investigated the feasibility of such measurements on clay minerals.…”
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confidence: 99%
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“…[2][3][4][5] By modulating the tip-sample contact with an ultrasonic frequency oscillation, these methods show potential applications in reliable and accurate characterizations of elastic properties with nanoscale resolution. [6][7][8][9][10][11][12] In CR-AFM, either or both the tip and the sample are vibrated with an ultrahigh frequency while the tip contacting the sample surface. By measuring the contact resonances of the cantilever, and by employing appropriate theoretical models, the local contact stiffness and, subsequently, the local elastic modulus can be obtained quantitatively.…”
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confidence: 99%
“…Finally, the standard sample is measured again to ascertain that the tip remained intact during the measurement. An averaged value between both standard measurements is used as tip radius for the calculation of the Young's modulus in the unknown sample [Kester et al, 2000;Rabe et al, 2001].[7] Kester et al [2000] give an accuracy of the Young's modulus from the average of the scatter and considerations of the simplifications mentioned above to be about 40%. By comparing indentation moduli of silicon, Rabe et al [2001] have shown that it is possible to differentiate between indentation moduli of Si (100) and Si (111) X -1 measurements on a softer material, polystyrene, showed that an accuracy of at least 40% can be expected for such materials.…”
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confidence: 99%