1968
DOI: 10.1016/0375-9474(68)90200-5
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Measurement of αK for the 91.5 keV E2 transition in 164Er

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Cited by 5 publications
(1 citation statement)
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“…A t times, some of t h e s e unwanted r a d i a t i o n s can be eliminated by c o i n c idence techniques o r h i g h -r e s o l u t i o n apparatus. Nelson and Hatch (18,19) employed a b e n t -c r y s t a l spectrometer t o measure K x-ray t o gamma-ray r a t i o s i n t h e decays of ~m '~' , Ho 166 and ~u~~~' : Boneau and Hatch (20) used a normal NaI(T1) s c i n t i l l a -' , t i o n c r y s t a l i n a coincidence arrangement t o measure a~ f o r a t r a n s i t i o n i n ~r~~~ by t h i s method. I n t h e work r e p o r t e d here, t h e conversion c o e f f i c i e n t f o r a t r a n s i t i o n i n t h e decay of ~m~~~ was found from t h e K x-ray t o gamma-ray r a t i o determined with a semiconductor d e t e c t o r .…”
Section: K X-ray To Gamma-ray Ratiomentioning
confidence: 99%
“…A t times, some of t h e s e unwanted r a d i a t i o n s can be eliminated by c o i n c idence techniques o r h i g h -r e s o l u t i o n apparatus. Nelson and Hatch (18,19) employed a b e n t -c r y s t a l spectrometer t o measure K x-ray t o gamma-ray r a t i o s i n t h e decays of ~m '~' , Ho 166 and ~u~~~' : Boneau and Hatch (20) used a normal NaI(T1) s c i n t i l l a -' , t i o n c r y s t a l i n a coincidence arrangement t o measure a~ f o r a t r a n s i t i o n i n ~r~~~ by t h i s method. I n t h e work r e p o r t e d here, t h e conversion c o e f f i c i e n t f o r a t r a n s i t i o n i n t h e decay of ~m~~~ was found from t h e K x-ray t o gamma-ray r a t i o determined with a semiconductor d e t e c t o r .…”
Section: K X-ray To Gamma-ray Ratiomentioning
confidence: 99%