Measurements and analysis of the dark I-V-T characteristics of a photovoltaic cell: KX0B22-12X1F

Bonkoungou, Dominique; Guingané, Toussaint; Korsaga, Éric; Tassembédo, Sosthène; Koalaga, Zacharie; Zougmoré, François; Darga, Arouna

doi:10.1109/icsmartgrid49881.2020.9144904

Cited by 4 publications

(7 citation statements)

References 23 publications

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“…A desktop computer is used to processes the measured data using LABVIEW. To measure the I-V curve under dark we used the procedure described into [11]. For light I-V curve measurements, the cell is illuminated by a halogen (ORIEL) .This last is fed by a halogen power supply.…”

Section: Methodsmentioning

confidence: 99%

“…are obtained by fitting (1) to a set of measured data using a nonlinear squares method of dark I-V measurement data. The standard deviation (SD) between the computed and measured data is less than 3% [11].…”

Section: I-v Characteristics Under Dark Conditionmentioning

confidence: 99%

“…To analyze the results obtained for the various parameters   [11], we have made additional measurements in light condition. Under illuminated condition, the PV cell generate a photocurrent light I and this last has to be added to (1) expressed by (2):…”

Section: I-v Characteristics Under Illuminated Conditionmentioning

confidence: 99%

“…It is a complementary study of a previous work in which parameters of a typical solar cell named KX0B22-12X1F have been extracted under dark condition. This work also extends the use of dark as well as light I-V measurements to modules configurations of cells and uses a nonlinear least squares method [11] to evaluate the cell efficiency parameters in the modules. Results obtained are used to analyze ASTESJ ISSN: 2415-6698 the shade impact in the PV cell efficiency and the effect of the cell imperfection on PV module efficiency.…”

Section: Introductionmentioning

confidence: 99%

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Parameters Degradation Analysis of a Silicon Solar Cell in Dark/Light Condition using Measured I-V Data

Bonkoungou¹,

Guingané²,

Korsaga³

et al. 2021

Adv. sci. technol. eng. syst. j.

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In this paper, we investigate and analyze parameters degradation in a typical photovoltaic (PV) cell, which lead to power loss under dark as well as light condition using measured current-voltage (I-V) data. A nonlinear least squares method to extract the parameters such as the reverse saturation currents, the ideality factors, the series and shunt resistances of the cell from the dark current-voltage (I-V) curves is used. In order to analysis the sensitivity of the dark current-voltage (I-V) measurement to each of the six extracted parameters as a function of the voltage as well as the temperature and the density current, we simulate the operation of a silicon solar cell (KXB0022-12X1F). The analysis of the dark current-voltage (I-V) curves permit us to detect variation as small as 15% in the series resistance. We also extends the use of dark as well as light current-voltage (I-V) measurements to modules configurations of cells and uses a nonlinear least squares method to evaluate the cell efficiency parameters in the modules. Results obtained show a degradation of the values of the maximum power (Pmax) as compared to initial values by about 12, 3%, 12, 06% and 10, 21 % respectively in Total-Cross-Tied (TCT), Bridge-Link (BL) and Honey-Comb (HC) configurations.

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Section: Methodsmentioning

confidence: 99%

Section: I-v Characteristics Under Dark Conditionmentioning

confidence: 99%

Section: I-v Characteristics Under Illuminated Conditionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Parameters Degradation Analysis of a Silicon Solar Cell in Dark/Light Condition using Measured I-V Data

Bonkoungou¹,

Guingané²,

Korsaga³

et al. 2021

Adv. sci. technol. eng. syst. j.

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“…Another is the SPV method, which is founded on evaluating illuminationinduced variations in the surface voltage. There is also the four-point probe for measuring sheet and bulk resistance of the cell [10][11][12][13].…”

Section: Introductionmentioning

confidence: 99%

Performance Investigation of the lifetime and efficiency of solar cell using surface photovoltage (SPV) method

Chowdhury

Hossain

Longo³

et al. 2021

IJRER

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In this paper, the optical characterisation of mono crystalline fabricated solar cells has been investigated focusing on the minority carrier flow using surface photovoltage (SPV) technique and the efficiency of the solar cells has been evaluated by means of the sun simulator analysis. A computer-controlled incidence measurement system was conceived for SPV evaluations based on a mini mono-chromator, which was driven by a stepper motor to various wavelengths in the spectral range of 400-1200 nm. SPV is typically quantified by means of Standard Research 510 lock-in amplifiers. A LabVIEW platform is employed for system control and data acquisition. Every step of the measurement has been described in detail throughout the completely experimental procedure. Once computing the testing data acquired from monocrystalline silicon solar cell measurement, the length (L) of the minority carrier diffusion and lifetime (τ) were evaluated and results derived were 92 µm and nearly 3.135 µs, respectively. From the experimental data we have successfully found the efficiency as 16.05% using the Sun Simulator K3000 LAB55. The results from the experimental data has promising application to assess the quality of the solar cells that are being used.

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Accurate Identification of the Electrical Parameters of Triple-Diode Photovoltaic Model Using a Metaheuristic Algorithm

Yeşilbudak

2021

2021 9th International Conference on Smart Grid (icSmartGrid)

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Measurements and analysis of the dark I-V-T characteristics of a photovoltaic cell: KX0B22-12X1F

Cited by 4 publications

References 23 publications

Parameters Degradation Analysis of a Silicon Solar Cell in Dark/Light Condition using Measured I-V Data

Parameters Degradation Analysis of a Silicon Solar Cell in Dark/Light Condition using Measured I-V Data

Performance Investigation of the lifetime and efficiency of solar cell using surface photovoltage (SPV) method

Accurate Identification of the Electrical Parameters of Triple-Diode Photovoltaic Model Using a Metaheuristic Algorithm

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