2007
DOI: 10.1116/1.2779045
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Measurements of acid generation by extreme ultraviolet irradiation in lithographic films

Abstract: Extreme ultraviolet lithography based nanofabrication using a bilevel photoresistExtreme ultraviolet ͑EUV͒ lithography requires photoresist materials that incorporate highly efficient photoacid generators ͑PAGs͒ due to the low intensity of the currently available EUV light sources. It is therefore necessary to understand the parameters that control acid generation mechanisms in photoresists under EUV irradiation, such as photoacid generator and base quencher structure, polymer matrix effects, and the interacti… Show more

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Cited by 18 publications
(23 citation statements)
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“…PAG-11 bears semi-fluorinated phenyl moieties with the resulting reduction in hydrogen content and increase in hydrophobicity compared to other PAGs. Aggregation might be effective for PAG-11 as it was shown for PAGs with high fluorine content blended in non-polar resist matrices [17], thus reducing the effective PAG concentration with the detrimental impact in photospeed. In the case of PAG-12, the unusual acid generator cation [37] was chosen in order to address the possible negative impact of outgassed iodine in EUV optics reflectivity and investigate the effect of the geometrically strained C-I + -C bond angle on photospeed response.…”
Section: Photospeed Determinationmentioning
confidence: 94%
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“…PAG-11 bears semi-fluorinated phenyl moieties with the resulting reduction in hydrogen content and increase in hydrophobicity compared to other PAGs. Aggregation might be effective for PAG-11 as it was shown for PAGs with high fluorine content blended in non-polar resist matrices [17], thus reducing the effective PAG concentration with the detrimental impact in photospeed. In the case of PAG-12, the unusual acid generator cation [37] was chosen in order to address the possible negative impact of outgassed iodine in EUV optics reflectivity and investigate the effect of the geometrically strained C-I + -C bond angle on photospeed response.…”
Section: Photospeed Determinationmentioning
confidence: 94%
“…Ultimately, acid generation efficiency is described by the quantum yield (ϕ), defined as the total number of photogenerated acid molecules per absorbed EUV photon, which is dependent on the initial PAG loading. Reported quantum yield values are around 2-3 for PAG concentrations typically used in photoresist formulations [16][17][18][19], evidencing the important role that EUV photoelectrons play in image formation. …”
Section: Euv Radiation Interaction With Resist Matrixmentioning
confidence: 99%
“…118,127,128) The relationship between reductive potential and relative acid yield has been reported for sulfonium and iodonium salts as well as for nonionic acid generators. 125,126) Also, the reactivity of acid generators with solvated electrons formed in solutions has been measured from the viewpoint of molecular structure dependence.…”
Section: )mentioning
confidence: 99%
“…2 Photoacids also provide an efficient means of generating protons at a specific time, and this concept has been used extensively in the development of polymers for photolithography. [4][5][6] The change in acidity between the ground and excited states of photoacids can be extraordinary, with the acidity equilibrium constant (K a ) differing by more than 10 orders of magnitude in some cases. 7 Photoacids have been studied in both gas and condensed phases, with benzene and naphthalene derivatives examined most often in the gas phase, [8][9][10][11] and naphthalene and pyrene derivatives studied more extensively in condensed phases.…”
Section: Introductionmentioning
confidence: 99%