2007
DOI: 10.1007/s10686-007-9081-6
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Measurements of charge diffusion in deep-depletion CCDs by optical diffraction

Abstract: The charge diffusion is measured in back illuminated, fully depleted, 250µm thick CCDs by imaging the diffraction pattern of a double slit. The CCDs studied are the focal plane detectors for the Dark Energy Camera (DECam) instrument currently under construction for the Dark Energy Survey (DES). The results presented here indicate that the dispersion of charge due to diffusion can be kept below the DES specification ( σ d < 7.0 µm ).

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Cited by 7 publications
(6 citation statements)
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“…5. This measurement done with X-rays is consistent with measurements done with optical methods on the same detectors [22], and on other thick detectors developed by LBNL [24] [25].…”
Section: High Resistivity Ccd Detectorssupporting
confidence: 85%
“…5. This measurement done with X-rays is consistent with measurements done with optical methods on the same detectors [22], and on other thick detectors developed by LBNL [24] [25].…”
Section: High Resistivity Ccd Detectorssupporting
confidence: 85%
“…plated Invar pedestal or "foot" that had two alignment/ mounting pins pressed into it. In all cases the glue used in assembly was Epotek 301-2, which was found suitable for this work because of its low viscosity and good cryogenic properties (Cease et al 2006). A CCD flatness measurement, which involved a time-consuming surface scan of the CCDs at operating temperature, was performed on a small sample of the devices.…”
Section: Packaging and Testing 2048 × 4096 Imaging Ccdsmentioning
confidence: 99%
“…If the CCD did not pass these criteria, it was removed from the sample of possible science-grade CCDs, so it was not studied further. The second-stage tests required more significant manual setup and included determination of the charge diffusion using X-rays and a testpattern (Cease et al 2008b), chargetransfer efficiency, and dark current and QE as a function of temperature during the warm-up. All of the CCD modules were inspected for thickness and flatness using an optical microscope at room temperature.…”
Section: Packaging and Testing 2048 × 4096 Imaging Ccdsmentioning
confidence: 99%
“…We developed a new technique [10] to measure charge diffusion based on Fourier analysis of the spatial resolution of a double slit diffraction pattern as the substrate voltage is varied. We measured the diffusion vs. substrate voltage in several 2k x 2k CCDs.…”
Section: Charge Diffusionmentioning
confidence: 99%