Measurements of low-frequency noise for testing the reliability of VLSI interconnects of mixed geometry

Supraja, P. Sai; Bhandhavya, N.; Srinivas, P. Bala; Singh, Mahesh K.

doi:10.1063/5.0190644

Recent Trends in Materials and Manufacturing Technologies (Rmmt-2022)

2024

DOI: 10.1063/5.0190644

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Measurements of low-frequency noise for testing the reliability of VLSI interconnects of mixed geometry

P. Sai Supraja,

N. Bhandhavya,

P. Bala Srinivas

et al.

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Measurements of low-frequency noise for testing the reliability of VLSI interconnects of mixed geometry

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References 14 publications

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