Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy

Dinelli, Franco; Biswas, SK; Briggs, G. A. D.; Kolosov, Oleg

doi:10.1103/physrevb.61.13995

Cited by 85 publications

(87 citation statements)

References 36 publications

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“…[45] can be very small. The specifics of the cantilever spectrum and contact behavior determine how small the linear response is and whether it is "dynamically static" [DIN00]. Thus, it is still unclear whether the response observed in UFM experiments is due to a linear response averaged over a nonlinear profile or due to more complex nonlinear behavior, such as described in section 2.3 and in [TUR03].…”

Section: Measurements and Analysismentioning

confidence: 99%

“…Because it is difficult to characterize the tip directly, approaches that eliminate the need for such information have been developed. UFM methods for obtaining quantitative elastic-property information were investigated extensively using an approach called differential UFM [KOL93,DIN00]. With this method, the cantilever response was measured for two different applied forces.…”

Section: Measurements and Analysismentioning

confidence: 99%

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Ultrasonic Studies of the Fundamental Mechanisms of Recrystallization and Sintering of Metals

Turner¹

2005

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ObjectivesThe purpose of this project was to develop a fundamental understanding of the interaction of an ultrasonic wave with complex media, with specific emphases on recrystallization and sintering of metals. A combined analytical, numerical, and experimental research program was implemented. Theoretical models of elastic wave propagation through these complex materials were developed using stochastic wave field techniques. The numerical simulations focused on finite element wave propagation solutions through complex media. The experimental efforts were focused on corroboration of the models developed and on the development of new experimental techniques. The analytical and numerical research allows the experimental results to be interpreted quantitatively. Alteration in Collaborative ArrangementIn fall 2002, the Ames Lab partner, Dr. James C. Foley, announced that he was leaving for another position at Los Alamos National Laboratory. Dr. R. Bruce Thompson has served as the primary contact for this collaboration since Dr. Foley departed. Accomplishments (Recrystallization)Analytical Modeling. Expressions for the ultrasonic attenuation in media with arbitrary texture have been developed using stochastic wave propagation theory. Initial attempts at deriving simple expressions for the attenuation were unsuccessful. Therefore, a modified technique was developed that relies slightly more on numerical calculations. The method is based on a generalized function of a single scalar variable σ that characterizes the state of texture. In this case the weighting function for the individual grains is given by ( ) with θ as the grain orientation angle. Thus, when σ → 0 all grains are aligned and the material is transversely isotropic at the macroscale. As σ → ∞, all grains are randomly oriented and the material is isotropic at the macroscale.In terms of attenuation, the covariance of the microstructure is the primary quantity needed for the calculation of attenuation. It is defined by in which both Eqs. (2) and (3) include the grain orientation distribution function F such that and are dependent on σ. Example results using Eq. (2) are shown in Fig. 1 for both the average elastic properties as well as quasilongitudinal slowness surfaces in terms of σ. The transition from transversely isotropy to complete isotropy is captured well using the grain orientation distribution function. Example results for attenuation are shown in Fig. 2. Again, the transition from transverse isotropy to complete isotropy is shown. Of particular note is the peak observed in the SH attenuation when σ is about 0.5. Such information may be useful for process monitoring. (a) (b)Progress was also made in the study of multiple scattering in slab geometries. These results have applications associated with heterogeneous bonding and interface layers. Two example results are shown in Fig. 3. The layer is insonified by a plane longitudinal wave. One question in the multiple scattering regime is associated with the applicability of the diffusion li...

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Section: Measurements and Analysismentioning

confidence: 99%

Section: Measurements and Analysismentioning

confidence: 99%

Ultrasonic Studies of the Fundamental Mechanisms of Recrystallization and Sintering of Metals

Turner¹

2005

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“…By measuring the contact resonances of the cantilever, and by employing appropriate theoretical models, the local contact stiffness and, subsequently, the local elastic modulus can be obtained quantitatively. [13][14][15][16] Moreover, by modulating the tip-sample interaction at a frequency close to one of the contact resonance frequencies while scanning the sample surface, or by recording contact resonances point-by-point across the scan area and calculating subsequently, semi-quantitative or even quantitative mapping of the mechanical properties of the sample surface can be realized. [17][18][19][20][21][22] However, the material properties, contact conditions, loading forces, excitation amplitudes and the operating frequency can affect the final results.…”

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confidence: 99%

Image contrast reversals in contact resonance atomic force microscopy

Chen

2015

AIP Advances

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Multiple image contrast inversions are observed along with the increase of modulation frequency for contact resonance atomic force microscopy (CR-AFM) imaging of a highly oriented pyrolytic graphite (HOPG) specimen. Analysis of the contact vibrational spectra indicates that the inversions can be attributed to structure-induced variations of tip-sample contact mechanics. Contact stiffness and damping at HOPG step edges exhibit significant increases relative to those in the flat regions. For quantitative evaluation of mechanical properties in CR-AFM, coupling effects of the surface geometry must be considered.

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“…From the analysis of the ultrasonic curves, information about the tip-sample interaction force can be obtained, and the elastic and adhesive properties of the tip-sample contact can be derived. The procedure of differential UFM has been proposed to extract quantitative information about the sample stiffness with nanoscale resolution [38], based on the measurement of the threshold amplitudes a i of the ultrasonic curves for two different initial tip-sample normal forces F i . If the normal forces do not differ much, the effective contact stiffness S eff can be obtained as follows…”

Section: Ufm Curvesmentioning

confidence: 99%

“…Simulations of the UFM curves have been done introducing the concept of modified tip-sample force curves [38] (see Fig. 3.7).…”

Section: Ufm Curvesmentioning

confidence: 99%

Mechanical Diode-Based Ultrasonic Atomic Force Microscopies

Cuberes¹

Applied Scanning Probe Methods XI

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Abstract. Recent advances in mechanical diode-based ultrasonic force microscopy techniques are reviewed. The potential of Ultrasonic Force Microscopy (UFM) for the study of material elastic properties is explained in detail. Advantages of the application of UFM in nanofabrication are discussed. Mechanical-Diode Ultrasonic Friction Force Microscopy (MD-UFFM) is introduced, and compared with Lateral Acoustic Force Microscopy (LAFM) and Torsional Resonance (TR) -Atomic Force Microscopy (AFM). MD-UFFM provides a new method for the study of shear elasticity, viscoelasticity, and tribological properties on the nanoscale. The excitation of beats at nanocontacts and the implementation of Heterodyne Force Microscopy (HFM) are described. HFM introduces a very interesting procedure to take advantage of the time resolution inherent in high-frequency actuation.

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Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy

Cited by 85 publications

References 36 publications

Ultrasonic Studies of the Fundamental Mechanisms of Recrystallization and Sintering of Metals

Ultrasonic Studies of the Fundamental Mechanisms of Recrystallization and Sintering of Metals

Image contrast reversals in contact resonance atomic force microscopy

Mechanical Diode-Based Ultrasonic Atomic Force Microscopies

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