Measurements of Stray Magnetic Fields of Fe-Rich Amorphous Microwires Using a Scanning GMI Magnetometer

Abstract

A scanning magnetometer based on a magnetoimpedance sensor with a 1 mm spatial resolution and 10 nT sensitivity was used to study stray magnetic fields of Fe74B13Si11C2 amorphous ferromagnetic microwires. Spatial magnetic images and vertical component profiles of stray magnetic fields of the studied microwires were obtained in a longitudinal homogeneous magnetic field of Helmholtz coils with a strength in the range of ±600 A/m. A magnetic calculation method is suggested that allows for using the measured magnetic fields to determine the magnitude and pattern of magnetization for the microwire. Characteristic values of the microwires’ average magnetization and width of closure domains for various values of bias fields were found.