2007
DOI: 10.1016/j.jeurceramsoc.2006.11.008
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Measurements of the surface resistance and conductivity of thin conductive films at frequency about 1GHz employing dielectric resonator technique

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Cited by 9 publications
(2 citation statements)
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“…This plays an important role in the on-state conductivity of the Ge-doped VO 2 , as ideally it is not desirable to operate far below the skin depth in rf-microwave design. The thin film thickness/skin depth ratio should be as big as possible, else the σ dc_ON values measured in dc may not be obtained while working in ac, leading to potentially bigger conductive losses. …”
Section: Resultsmentioning
confidence: 99%
“…This plays an important role in the on-state conductivity of the Ge-doped VO 2 , as ideally it is not desirable to operate far below the skin depth in rf-microwave design. The thin film thickness/skin depth ratio should be as big as possible, else the σ dc_ON values measured in dc may not be obtained while working in ac, leading to potentially bigger conductive losses. …”
Section: Resultsmentioning
confidence: 99%
“…The accuracy of the measurement using the dielectric resonator relies on the assumption that the conductor deposit is bulk. The deposited conductor is only assumed to be bulk if its thickness is at least 3δ, where δ = 1 √ πf κμ [6]. If the deposited conductor is thinner, the electromagnetic field can in part penetrate through the conductor into the carrier.…”
Section: Surface Resistance Measurements By Means Of a Dielectric Resmentioning
confidence: 99%