1997
DOI: 10.1364/ao.36.009109
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Measurements of the Thickness Uniformity of Liquid Crystal Layer

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Cited by 4 publications
(6 citation statements)
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“…Interferometric methods, such as a polarization based interferometer [19], Mach-Zehnder interferometer [20], or holographic based techniques as in [21][22][23], have been used for qualitative evaluation of the flatness distortion of LC based devices and, therefore, of the retardance inhomogeneity. The objective of [19][20][21][22] is to compensate the phase distortion introduced by a pixelated LC device in order to use it in coherent optical processing techniques.…”
Section: Introductionmentioning
confidence: 99%
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“…Interferometric methods, such as a polarization based interferometer [19], Mach-Zehnder interferometer [20], or holographic based techniques as in [21][22][23], have been used for qualitative evaluation of the flatness distortion of LC based devices and, therefore, of the retardance inhomogeneity. The objective of [19][20][21][22] is to compensate the phase distortion introduced by a pixelated LC device in order to use it in coherent optical processing techniques.…”
Section: Introductionmentioning
confidence: 99%
“…The objective of [19][20][21][22] is to compensate the phase distortion introduced by a pixelated LC device in order to use it in coherent optical processing techniques. These kinds of compensation are not applicable to monopixel devices, such as LCVRs, or are impractical in high-quality, diffraction-limited imaging systems in which these LCVRs are to be used.…”
Section: Introductionmentioning
confidence: 99%
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