2011 International Symposium on Empirical Software Engineering and Measurement 2011
DOI: 10.1109/esem.2011.31
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Measuring Architectural Change for Defect Estimation and Localization

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Cited by 6 publications
(6 citation statements)
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“…In our previous work, we have presented and evaluated a measure for structural change as an indicator of faultproneness of classes [21]. We use a graph kernel, specifically the Neighborhood Hash Kernel (NHK) [8], to measure structural distance between the graph representations of consecutive releases of a software system.…”
Section: Methodsmentioning
confidence: 99%
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“…In our previous work, we have presented and evaluated a measure for structural change as an indicator of faultproneness of classes [21]. We use a graph kernel, specifically the Neighborhood Hash Kernel (NHK) [8], to measure structural distance between the graph representations of consecutive releases of a software system.…”
Section: Methodsmentioning
confidence: 99%
“…Defects in issue trackers, for instance, might not be (correctly) reported for all code versions. In previous work, we presented a method to measure structural change in software systems and derived a metric for the fault-proneness of classes [21]. We represented software structure at the class-level and our timeline was given by the releases of the systems we examined.…”
Section: Introductionmentioning
confidence: 99%
“…They also used network measures as an aid for developers in indicating important files and binaries. In our previous work (Steff, 2011), we added to this area of research by showing that the change of dependencies, i.e. structural change, was an even stronger indicator of faulty classes than static measures thus far presented in the literature.…”
Section: Defect Predictionmentioning
confidence: 99%
“…These labels allow us now to compare the neighborhood structure of nodes across releases. The number of distinct bit labels (NDBL) measure introduced in (Steff, 2011) reflects changes for each neighborhood size. However, we use it only pairwise on bit labels l for consecutive releases r-1 and r, such that we obtain for each class:…”
Section: Design Churn (Independent Variable)mentioning
confidence: 99%
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