Measuring interface electrostatic potential and surface charge in a scanning electron microscope

Sychugov, Ilya; Nakayama, Yoshiko; Mitsuishi, Kazutaka

doi:10.1116/1.3253475

Cited by 3 publications

(2 citation statements)

References 8 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Although contrast mechanisms for the SE collection are undoubtedly due to multiple factors, and are not fully understood, they have been shown to include an influence of the surface potential [12][13][14]. By collecting images for varying values of Vrev, the change in surface potential with Vrev can be identified.…”

Section: Resultsmentioning

confidence: 98%

Diffused junctions in multicrystalline silicon solar cells studied by complementary scanning probe microscopy and scanning electron microscopy techniques

Heath

Jiang

Al‐Jassim

2010

2010 35th IEEE Photovoltaic Specialists Conference

View full text Add to dashboard Cite

The junction location in textured n + -p multicrystalline Si solar cell devices is quantitatively located. A comprehensive comparison is presented between secondary ion mass spectrometry (SIMS) and three microscopy techniques: scanning capacitance microscopy (SCM), scanning Kelvin probe microscopy (SKPM), and secondary electron contrast (SE) in the scanning electron microscope. The comparison includes capabilities of junction allocation, applicability of the measurement to give a two-dimensional analysis of a textured device, apparent imaging of the depletion region, depletion edge and depletion width determination, sample structure requirements for the specific methods, ease of sample preparation, and data acquisition time for high-quality measurements. We find that SE not only allows the most straightforward sample preparation and provides the quickest measurement, but also seems to show the depletion edge and width with a high degree of accuracy. This is verified by a comparison to PC1D simulations of the band bending in the bulk of the device. These data also contribute to our understanding of the origin of SE doping contrast. SKPM provides reliable junction identification but poor capability in determining the depletion width. All three techniques are able to show how well the diffused n + emitter region tracks the surface topography, with SCM and SE yielding the clearest images.

show abstract

Section: Resultsmentioning

confidence: 98%

Diffused junctions in multicrystalline silicon solar cells studied by complementary scanning probe microscopy and scanning electron microscopy techniques

Heath

Jiang

Al‐Jassim

2010

2010 35th IEEE Photovoltaic Specialists Conference

View full text Add to dashboard Cite

show abstract

“…At the same time, electrostatic charging from beam absorption is commonly observed in routine electron microscopy, especially for dielectric and poorly grounded conducting samples. 34 The rate and extent of charge accumulation should dictate the time dependence and magnitude of potential changes. Since the majority of the e − beam is either transmitted or scattered (elastic & inelastic), 30 the amount of excess charge accumulated at the working electrode under the beam is unknown, making quantitative analysis of the OCP changes speculative at this juncture.…”

Section: Influence Of the Ementioning

confidence: 99%

Electrochemical Measurements in In Situ TEM Experiments

Fahrenkrug

Alsem

Salmon

et al. 2017

J. Electrochem. Soc.

View full text Add to dashboard Cite

Potential sources of measurement error in electroanalytical analyses performed in-situ within a transmission electron microscope (TEM) are reported. Some relevant aspects of experimental set-up that impact noise are identified. The possibility of ground loops and recommendations that minimize them are presented. Offsets in the measured open circuit potential of working electrodes caused by the presence of the electron beam in TEM are demonstrated and discussed. This work also highlights the possibility of erroneous potential measurements when the electrode area exposed to electrolyte is significantly larger than the beam illumination area. General design criteria are proposed to assist in future electrochemical cell designs to mitigate electrochemical measurement artifacts inside a TEM.

show abstract

Improving the Properties of Prepared Pastry Margarine by Using Nanotechnology

Rabie

El-Gammal

Saafan

2018

Journal of Food and Dairy Sciences

View full text Add to dashboard Cite

ABSRTACTIn recent years nanotechnology-based products have been developed for use in many applications including food. Nano-emulsions are one of the most important applications because they have positive effects on the physical and chemical properties of various fatty products .In this study, pastry margarine was prepared using palm oil, palm stearin in addition of soybean and sunflower oils at the ratio of (5% soybean oil: 5% sunflower oil : 90% palm oil) and (5%soybean oil : 5%sunflower oil : 90% palm stearin) . Nanotechnology was used to modify the emulsifying properties of pastry margarine and to study the effect of these properties on its stability during storage period up to 11 weeks under cooling conditions at (4°C). Chemical, physical and emulsion characteristics of pastry margarine blends processed by nano-emulsion technique were determined and compared with the control samples. Nano-partecils of water phase which used in preparing of table margarine by nano-emulsion technique were examined using Transmission Electron Microscope and Zeta Potential Analyzer. Results showed that the margarine blends processed using this technique led to an improvement in emulsification properties and increased storage stability under refrigeration conditions. obtained results of chemical properties namely acid and peroxide values for margarine blends contained (5% soybean oil: 5% sunflower oil : 90% palm oil) and (5%soybean oil : 5%sunflower oil : 90% palm stearin) were determined and being 0.688 and 0.698mg KOH/gm oil and 3.198 and 3.290 ml.eqv/kg oil at the end of storage period in compared with the control samples which were 0.731 and 0.745 mg KOH/gm oil and 5.181 and 5.233 ml.eqv/kg oil. Results of physical properties namely colour and refractive index were also determined and indicated that all prepared margarine blends using nano-emulsion technique were more stable during storage than the others, while the results of emulsion stability indicated that the consistency of the creaming stability were nearly similar to those of control samples. Finally, it could concluded that using of nano-emulsion technique in preparing of pastry margarine could be prolonged stability and extend storage period.

show abstract

Measuring interface electrostatic potential and surface charge in a scanning electron microscope

Cited by 3 publications

References 8 publications

Diffused junctions in multicrystalline silicon solar cells studied by complementary scanning probe microscopy and scanning electron microscopy techniques

Diffused junctions in multicrystalline silicon solar cells studied by complementary scanning probe microscopy and scanning electron microscopy techniques

Electrochemical Measurements in In Situ TEM Experiments

Improving the Properties of Prepared Pastry Margarine by Using Nanotechnology

Contact Info

Product

Resources

About