Measuring of Parasitic Inductances Through Resonance Effects in GaN Half-Bridges

Holzmann, Simon; Franck, Kai; Schumann, Christian

doi:10.1109/dmc62632.2024.10812127

2024 IEEE Design Methodologies Conference (DMC) 2024

DOI: 10.1109/dmc62632.2024.10812127

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Measuring of Parasitic Inductances Through Resonance Effects in GaN Half-Bridges

Simon Holzmann,

Kai Franck,

Christian Schumann

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Measuring of Parasitic Inductances Through Resonance Effects in GaN Half-Bridges

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References 7 publications

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