Measuring of the Thickness of Thin Films with the Use of Harmonic Antisymmetric Lamb Waves

Tolipov, Kh. B.

doi:10.1007/s11018-018-1477-3

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(3 citation statements)

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“…Nowadays, ultrasonic guided waves are widely used not only for detection of various defects in planar structures [ 5 , 6 , 7 ], but for material characterization purposes also. Such characterization is directed to determination of some elastic properties and a thickness of the sample under testing [ 7 , 8 , 9 , 10 , 11 , 12 ].…”

Section: Introductionmentioning

confidence: 99%

“…Determination of elastic properties and thickness of thin plates and films usually is based on measurement of propagation velocities of at least two different guided wave modes, for example A 0 and S 0 modes, and reconstruction of those parameters from the measured velocities [ 7 , 8 , 9 , 10 , 11 , 12 , 13 , 14 ]. For reconstruction, the theoretical velocity dispersion curves are adjusted to experimental results, and in such way the elastic constants and/or thickness of the thin planar specimen are obtained.…”

Section: Introductionmentioning

confidence: 99%

“…Measurement of the thickness of metallic films with an antisymmetric Lamb A 0 wave mode was discussed in [ 12 ]. The Lamb wave was excited by a piezoelectric element and picked up by an electromagnetic acoustic transducer.…”

Section: Introductionmentioning

confidence: 99%

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Simultaneous Measurement of Thickness and Elastic Properties of Thin Plastic Films by Means of Ultrasonic Guided Waves

Kažys

Tumšys

2021

Sensors

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Ultrasonic guided waves are already used for material characterization. The advantage of these waves is that they propagate in the plane of a plate and their propagation characteristics are sensitive to properties of the material. The objective of this research was to develop an ultrasonic method that could be used to measure the properties of thin plastic polyvinylchloride films (PVC). The proposed method exploits two fundamental Lamb wave modes, A0 and S0, for measurement of a thin film thickness and Young’s modulus. The Young’s modulus is found from the measured phased velocity of the S0 mode and the film thickness from the velocities of both A0 and S0 modes. By using the proposed semi-contactless measurement algorithm, the Young’s modulus and thickness of different thickness (150 µm and 200 µm) PVC films were measured. The uncertainty of thickness measurements of the thinner 150 µm PVC film is 2% and the thicker 200 µm PVC film is 3.9%.

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