Measuring optical beam shear angle of polarizing prisms beyond the diffraction limit with localization method

Chiu, Hoi Chun; Zeng, Zhuohui; Zhao, Luwei; Zhao, Teng; Du, Shengwang; Chen, Xian

doi:10.1016/j.optcom.2018.11.046

Cited by 4 publications

(4 citation statements)

References 13 publications

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“…Several techniques have been deployed in the past to carry out this integration, with Wiener deconvolution gathering most attention 33 , 37 . In our experiments, however, we found that Wiener deconvolution required curation of several parameters of the point spread function, including the shear distance between the e- and o-waves that needs to be determined experimentally 48 . Even after these adjustments, we found that image reconstruction with Wiener deconvolution was not satisfactory (Fig.…”

Section: Resultsmentioning

confidence: 80%

Quantitative phase imaging by gradient retardance optical microscopy

Zhang,

Sarollahi,

Luckhart

et al. 2024

Sci Rep

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Quantitative phase imaging (QPI) has become a vital tool in bioimaging, offering precise measurements of wavefront distortion and, thus, of key cellular metabolism metrics, such as dry mass and density. However, only a few QPI applications have been demonstrated in optically thick specimens, where scattering increases background and reduces contrast. Building upon the concept of structured illumination interferometry, we introduce Gradient Retardance Optical Microscopy (GROM) for QPI of both thin and thick samples. GROM transforms any standard Differential Interference Contrast (DIC) microscope into a QPI platform by incorporating a liquid crystal retarder into the illumination path, enabling independent phase-shifting of the DIC microscope's sheared beams. GROM greatly simplifies related configurations, reduces costs, and eradicates energy losses in parallel imaging modalities, such as fluorescence. We successfully tested GROM on a diverse range of specimens, from microbes and red blood cells to optically thick (~ 300 μm) plant roots without fixation or clearing.

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Section: Resultsmentioning

confidence: 80%

Quantitative phase imaging by gradient retardance optical microscopy

Zhang,

Sarollahi,

Luckhart

et al. 2024

Sci Rep

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“…Different beam shear distances are achieved by using the Nomarski prisms with different optical properties. We used the localization method [21] to characterize each of the distances in the experiment. The intensity image is captured by the imaging module.…”

Section: Discussionmentioning

confidence: 99%

“…The angle between differential light paths is determined as ϵ = ∆/f. Details of the measurement are introduced in [21]. The surface step of specimen is characterized by the differential light through the imaging module as shown in figure 1(c).…”

Section: Methods and Principlementioning

confidence: 99%

“…The microscope we developed is similar to most differential interference contrast (DIC) microscopes [13][14][15][16][17][18][19][20], but we aim at quantitative measures of surface height variation instead of producing phase contrast images. We utilize the localization analysis [21] to precisely determine the shear distance between two orthogonally polarized light rays, by which we measure the surface topography from the phase lag between the differentiated light path [22,23]. Since the phase contrast of an image is no longer the scope here, we name our optical system as Differential Interference Microscopy (DInM).…”

Section: Introductionmentioning

confidence: 99%

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Subnanometer accuracy of surface characterization by reflected-light differential interference microscopy

Chan¹,

Du²,

Chen³

2022

Meas. Sci. Technol.

Self Cite

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We theorize the surface step characterization by reﬂected incoherent-light diﬀerential interference microscopy with consideration of the optical diﬀraction eﬀect. With the integration of localization analysis, we develop a quantitative diﬀerential interference optical system, by which we demonstrate that the axial resolution of measuring surface height variation is sensitive to the shear distance between the two spatially diﬀerentiated beams. We fabricate three nanometer-size steps by√ photolithography, and successfully characterize their 1D height variations with 0.13 nm/ Hz axial precision. Our result suggests that the optical diﬀerential interference microscopy can be used for real-time characterization of surface structure with a subnanometer accuracy and a large ﬁeld of view, which is greatly beneﬁcial to the surface characterization of micro/nano-electromechanical systems.

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In situ characterization of buckling dynamics in silicon microribbon on an elastomer substrate

Zeng

Chen

2021

Extreme Mechanics Letters

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Measuring optical beam shear angle of polarizing prisms beyond the diffraction limit with localization method

Cited by 4 publications

References 13 publications

Quantitative phase imaging by gradient retardance optical microscopy

Quantitative phase imaging by gradient retardance optical microscopy

Subnanometer accuracy of surface characterization by reflected-light differential interference microscopy

In situ characterization of buckling dynamics in silicon microribbon on an elastomer substrate

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