Society of Vacuum Coaters 56th (2013) Annual Technical Conference Proceedings 2013
DOI: 10.14332/svc13.proc.1037
|View full text |Cite
|
Sign up to set email alerts
|

Measuring Sharp Spectral Edges to High Optical Density

Abstract: Interference filters have improved over the years. Sharp spectral edges (> 1 db/nm) reach high optical density (OD > 8) in a few nm. In-situ optical monitoring to within 0.1 % error enables these levels of performance. Due to limitations related to f-number and resolution bandwidth, post-deposition testing in typical spectrophotometers cannot reveal the quality of today's filters. Laser based measurements at selected wavelengths prove that blocking above OD8 to OD9 is manufacturable with high yield. This paper… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 7 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?