Measuring system for registration of near-field power distribution in modes of planar and strip waveguides

Abstract

A measuring assembly to examine the distribution of light intensity in near field of planar and strip waveguides was presented. The image of near-field intensity distribution of waveguide modes was showed as well as their interferrential changes caused by the change in optic features of waveguide structure. The presented version of the station was the one to measure the power guided in particular modes with the same polarisation states.