2020
DOI: 10.3390/coatings10121211
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Measuring the Thickness of Metal Coatings: A Review of the Methods

Abstract: Thickness dramatically affects the functionality of coatings. Accordingly, the techniques in use to determine the thickness are of utmost importance for coatings research and technology. In this review, we analyse some of the most appropriate methods for determining the thickness of metallic coatings. In doing so, we classify the techniques into two categories: (i) destructive and (ii) non-destructive. We report on the peculiarity and accuracy of each of these methods with a focus on the pros and cons. The man… Show more

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Cited by 56 publications
(37 citation statements)
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“…These phase images represent the delay of the oscillation of the cantilever in tapping mode. The phase signal is sensitive to different material-related properties like composition, stiffness/softness and viscoelastic properties [ 57 ]. These patches on eADF4(C16)-RGD, eADF4(Ω16) and eADF4(Ω16)-RGD films ( Fig.…”
Section: Resultsmentioning
confidence: 99%
“…These phase images represent the delay of the oscillation of the cantilever in tapping mode. The phase signal is sensitive to different material-related properties like composition, stiffness/softness and viscoelastic properties [ 57 ]. These patches on eADF4(C16)-RGD, eADF4(Ω16) and eADF4(Ω16)-RGD films ( Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Equivalent metal film thickness determination with EDS spectra was made possible by applying the K-ratio method [43,44]. Selecting a particular X-ray emission signal of an element (in this case Kα for copper and Lα for palladium) in the EDS spectra, the ratio between the area of this signal derived from the metal layer with a specific thickness and the one derived from the bulk metal is called the K-ratio.…”
Section: Methodsmentioning
confidence: 99%
“…Selecting a particular X-ray emission signal of an element (in this case Kα for copper and Lα for palladium) in the EDS spectra, the ratio between the area of this signal derived from the metal layer with a specific thickness and the one derived from the bulk metal is called the K-ratio. In this case NIST DTSA-II software [45] was used to simulate the EDS spectra of different palladium films with known thicknesses using a Monte Carlo approach [43,44], applying the work parameters of the Hitachi SEM used for the real samples. The calibration curve obtained from the simulated K-ratios vs. standard metal film thickness was used to interpolate the K-ratio values obtained from real palladium films with unknown thicknesses.…”
Section: Methodsmentioning
confidence: 99%
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“…The Cu 2+ ions were reduced by an electrochemical one-step process on the polymer coated substrates in an acidic electrolyte solution (1.5 M H 2 SO 4 and 0.5 M CuSO 4 , pH ranging between 1 and 1.5). Potentiostatic and galvanostatic methods were both investigated, exploring different parameters combinations, in order to obtain a uniform layer of copper with a thickness between 1 and 4 µm [49,50]. In particular, the copper depositions on PEDOT/Pd, PEDOT/Au and PEDOT/ITO were performed at −0.8 V for 300 s, −0.007 A for 600 s and −0.9 V for 600 s, respectively.…”
Section: Copper Electrodepositionmentioning
confidence: 99%