Mechanical and Electrical Properties of Alkanethiol Self-Assembled Monolayers: A Conducting-Probe Atomic Force Microscopy Study

DelRio, Frank W.; Cook, Robert F.

doi:10.1007/978-3-642-10497-8_15

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Curve Fitting Function Force-distance Curve1

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2016

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“…The comparison of the apparent adhesive energies predicted by stochastic model and the experimental data [3].…”

Section: Curve Fitting Function Force-distance Curvementioning

confidence: 99%

A study of dry stiction phenomenon in MEMS using a computational stochastic multi-scale methodology

Hoang

Paquay³

et al. 2016

2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and

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Conclusions• A novel stochastic multiscale method to predict the probabilistic behaviors of micro structures involving adhesive contacts is developed.• The model is computationally effective.• The model is validated by a comparison with experimental data. Results• Comparison between direct MCS and stochastic model-based methods• The stochastic model-based method can predict the nominate properties of the crack length distribution.• Comparison between numerical prediction and experimental data [3]• The stochastic model-based method can predict the experimental results with high accuracy.

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“…The comparison of the apparent adhesive energies predicted by stochastic model and the experimental data [3].…”

Section: Curve Fitting Function Force-distance Curvementioning

confidence: 99%

A study of dry stiction phenomenon in MEMS using a computational stochastic multi-scale methodology

Hoang

Paquay³

et al. 2016

2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and

View full text Add to dashboard Cite

show abstract

Mechanical and Electrical Properties of Alkanethiol Self-Assembled Monolayers: A Conducting-Probe Atomic Force Microscopy Study

Cited by 1 publication

References 124 publications

A study of dry stiction phenomenon in MEMS using a computational stochastic multi-scale methodology

A study of dry stiction phenomenon in MEMS using a computational stochastic multi-scale methodology

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