2011
DOI: 10.1016/j.apsusc.2011.08.057
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Mechanical and electrochemical characterization of vanadium nitride (VN) thin films

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Cited by 114 publications
(64 citation statements)
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“…61 However, a lower lattice parameter has already been reported for VN thin films prepared by D.C. sputtering and could be explained by a compressive stress related to the deposition conditions. 62,63 Representative SEM images of VN thin films are shown in Figure 2. The VN film exhibits columnar growth on the glass substrate ( Figure 2a) with an average column diameter of 20 nm (Figure 2b).…”
Section: Resultsmentioning
confidence: 99%
“…61 However, a lower lattice parameter has already been reported for VN thin films prepared by D.C. sputtering and could be explained by a compressive stress related to the deposition conditions. 62,63 Representative SEM images of VN thin films are shown in Figure 2. The VN film exhibits columnar growth on the glass substrate ( Figure 2a) with an average column diameter of 20 nm (Figure 2b).…”
Section: Resultsmentioning
confidence: 99%
“…From the AFM analysis, it was obtained a grain size of 302 AE 8 nm and roughness of 87 AE 2 nm. Take in account the AFM image and grain size with roughness values, is possible to establish that Ar þ -ion bombardment generated by the application of negative bias causes a growth of elongated grains with discontinuous columnar structure with formation of pores on 8YSZ material due to high Ar þ impact [33]. Although the values reported follow the usual tendency of films grown under a substrate bias voltage, the 8YSZ films presented in this research have exhibit a larger grain size than films obtained in previous similar works deposited at lower temperatures [12,16,20].…”
Section: Microstructure Analysismentioning
confidence: 99%
“…The hardness HN, reduced Young's modulus Er and H 3 /E 2 ratio of treated and untreated samples are given in Table 2. The plastic deformation resistance (H 3 /E 2 ratio) is an indicator of a resistance to plastic deformation of the coating and a relationship between the hardness HN and the reduced Young's modulus Er [14][15]. The wear resistance relates to the high hardness HN and the reduced Young's modulus Er [16].…”
Section: Surface Image Analysismentioning
confidence: 99%