Mechanical and thermomechanical assessment of encapsulated solar cells by finite-element-simulation

Dietrich, Sascha; Pander, Matthias; Sander, Martin; Schulze, Stefan H.; Ebert, Matthias

doi:10.1117/12.860661

Cited by 57 publications

(34 citation statements)

References 1 publication

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“…In the past few years, the observation of different encapsulants leading to substantial differences in the fracture rates of silicon solar cells in the laminated form (i.e. PV modules) have become increasingly obvious and widely accepted [6,7]. Obviously, such different stress states as shown in this present study, would lead to very different silicon cell crack rates, and fracture mechanisms in general between Samples A vs. B.…”

Section: Va Handara Et Al Solar Energy Materials and Solar Cells 162mentioning

confidence: 74%

“…The total normal stress is the sum of the normal deviatoric and hydrostatic stress components as shown in Eqs. (5) and (6). However, the magnitude of normal deviatoric stress component are lower and hence, the hydrostatic stress typically represents the bulk of the total normal stress which will be the subject of this section.…”

Section: Residual Normal (Hydrostatic) Stress Evaluationmentioning

confidence: 99%

“…the residual and deviatoric stresses) and the ensuing fracture events have not been further explored in literature [8,9]. In the recent report by Dietrich et al [6], it was clearly shown that higher stiffness encapsulant induces cell cracks on PV module at lower load and vice versa for lower stiffness encapsulants. The effect of encapsulation stiffness at cold environment conditions on fracture propensity within PV module was reported by Mickiewicz et al [10].…”

Section: Introductionmentioning

confidence: 99%

“…The mini PV module is mounted on a XY high precision stage having range of 10 cm (4). As the beam strikes the mini module, it will be diffracted into multiple beam patterns (5), which are then captured by Charge Coupled Device (CCD) detector placed at a distance of 140 mm above the module sample (6). The CCD detector (having the resolution of 0.03°and active area of 179×169 mm 2 ) is comprised of pixels in which the relative change in position and size of the peak are extracted [24].…”

Section: Synchrotron X-ray Microdiffraction (µSxrd) Experimentsmentioning

confidence: 99%

“…To address this issue, solar PV module lamination materials and processes need to be fully understood [6,7]. The encapsulant materials, most commonly called as ethylene vinyl acetate (EVA) used for solar PV lamination must fulfill specific criteria such as high optical transmission, good dielectric properties, strong mechanical compliance and high adhesion strength.…”

Section: Introductionmentioning

confidence: 99%

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Probing stress and fracture mechanism in encapsulated thin silicon solar cells by synchrotron X-ray microdiffraction

Handara

Radchenko

Tippabhotla

et al. 2017

Solar Energy Materials and Solar Cells

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A B S T R A C TThin ( < 150 µm) silicon solar cell technology is attractive due to the significant cost reduction associated with it. Consequently, fracture mechanisms in the thin silicon solar cells during soldering and lamination need to be fully understood quantitatively in order to enable photovoltaics (PV) systems implementation in both manufacturing and field operations. Synchrotron X-ray Microdiffraction (µSXRD) has proven to be a very effective means to quantitatively probe the mechanical stress which is the driving force of the fracture mechanisms (initiation, propagation, and propensity) in the thin silicon solar cells, especially when they are already encapsulated. In this article, we present the first ever stress examination in encapsulated thin silicon solar cells and show how nominally the same silicon solar cells encapsulated by different polymer encapsulants could have very different residual stresses after the lamination process. It is then not difficult to see how the earlier observation, as reported by Sander et al. (2013) [1], of very different fracture rates within the same silicon solar cells encapsulated by different Ethylene Vinyl Acetate (EVA) materials could come about. The complete second degree tensor components of the residual stress of the silicon solar cells after lamination process are also reported in this paper signifying the full and unique capabilities of the Synchrotron X-Ray Microdiffraction technique not only for measuring residual stress but also for measuring other potential mechanical damage within thin silicon solar cells.

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Section: Va Handara Et Al Solar Energy Materials and Solar Cells 162mentioning

confidence: 74%

Section: Residual Normal (Hydrostatic) Stress Evaluationmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Synchrotron X-ray Microdiffraction (µSxrd) Experimentsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Probing stress and fracture mechanism in encapsulated thin silicon solar cells by synchrotron X-ray microdiffraction

Handara

Radchenko

Tippabhotla

et al. 2017

Solar Energy Materials and Solar Cells

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From cells to laminate: probing and modeling residual stress evolution in thin silicon photovoltaic modules using synchrotron X‐ray micro‐diffraction experiments and finite element simulations

Tippabhotla

Radchenko

Song

et al. 2017

Progress in Photovoltaics

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High stress and fracture of silicon crystalline solar cells has recently been observed in increasing percentages especially in solar photovoltaics (PV) modules involving thinner silicon solar cells (<200 um). Many failures due to fracture of cells have been reported from the field and handling. However, a significantly higher number of failures have also been reported during module integration (soldering/ stringing and lamination) indicating a PV laminate/module with significantly high residual stresses and hence more prone to cell fractures. We characterize the residual stress evolution in crystalline silicon solar cells during module integration process, which is the current knowledge gap. The residual stress characterization was achieved through a systematic research using synchrotron X-ray submicron diffraction experiments coupled with physics-based Finite Element modeling of the PV module integration process. Thought this work we also demonstrate the unique capability of Synchrotron X-ray submicron diffraction to quantitatively probe residual stress in encapsulated silicon solar cells that has ultimately enabled these findings leading to the enlightening of the role of soldering and encapsulation processes. While our experiments quantify the stress at different process states including encapsulated cells, our FEA simulations, for the first time unravel the physical reasoning for the stress evolution and expected to bridge the knowledge gap. This model can be further used to suggest methodologies that could lead to lower stress in encapsulated silicon solar cells, which are the subjects of our continued investigations.

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Degradation in photovoltaic encapsulation strength of attachment: Results of the first PVQAT TG5 artificial weathering study

Miller

Alharbi

Andreas

et al. 2020

Progress in Photovoltaics

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Delamination of the encapsulant in photovoltaic (PV) module technology results in immediate optical loss and may enable subsequent corrosion or mechanical damage. The effects of artificial weathering were not previously known; therefore, an empirical study was performed to survey the factors most affecting adhesion, including: the UV source (i.e., Xe or fluorescent lamp(s)); the optical filters for the lamp; the chamber temperature; and the relative humidity. Natural weathering was also performed at locations, including: Golden,

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Mechanical and thermomechanical assessment of encapsulated solar cells by finite-element-simulation

Cited by 57 publications

References 1 publication

Probing stress and fracture mechanism in encapsulated thin silicon solar cells by synchrotron X-ray microdiffraction

Probing stress and fracture mechanism in encapsulated thin silicon solar cells by synchrotron X-ray microdiffraction

From cells to laminate: probing and modeling residual stress evolution in thin silicon photovoltaic modules using synchrotron X‐ray micro‐diffraction experiments and finite element simulations

Degradation in photovoltaic encapsulation strength of attachment: Results of the first PVQAT TG5 artificial weathering study

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