Mechanical characterization of piezoelectric materials: A perspective on deformation behavior across different microstructural length scales

Abstract

Piezoelectric materials (PEMs) find a wide spectrum of applications that include, but are not limited to, sensors, actuators, semiconductors, memory devices, and energy harvesting systems due to their outstanding electromechanical and polarization characteristics. Notably, these PEMs can be employed across several length scales (both intrinsic and extrinsic) ranging from mesoscale (bulk ceramics) to nanoscale (thin films) during their applications. Over the years, progress in probing individual electrical and mechanical properties of PEM has been notable. However, proportional review articles providing the mechanical characterization of PEM are relatively few. The present article aims to give a tutorial on the mechanical testing of PEMs, ranging from the conventional bulk deformation experiments to the most recent small-scale testing techniques from a materials science perspective. The advent of nanotechnology has led materials scientists to develop in situ testing techniques to probe the real-time electromechanical behavior of PEMs. Therefore, this article presents a systematic outlook on ex situ and in situ deformation experiments in mechanical and electromechanical environments, related mechanical behavior, and ferroelectric/elastic distortion during deformation. The first part provides significant insights into the multifunctionality of PEM and various contributing microstructural length scales, followed by a motivation to characterize the mechanical properties from the application's point of view. In the midst, the mechanical behavior of PEM and related mechanical characterization techniques (from mesoscale to nanoscale) are highlighted. The last part summarizes current challenges, future perspectives, and important observations.

Exploring the Piezoelectric Properties of Bismuth Ferrite Thin Films Using Piezoelectric Force Microscopy: A Case Study

“…The bismuth ferrite is represented by various types of domain walls, based on crystal structure grow conditions. The common type is the 90 • domain wall [14,30], which separates regions with polarization vectors orientated perpendicularity. Another type of domain wall which is observed in bismuth ferrite thin films involves 180 • [14,30] and 109.5 • domain walls.…”

“…Among the different types of ferroelectric materials, Pb-based piezoceramics such as lead zirconate titanate (PZT), lead magnesium niobate-lead titanate (PMN-PT), and lead zinc niobate-lead titanate (PZN-PT) have attracted significant attention due to their superior properties and industrial applications. PFM studies of PZT [13,14] revealed the presence of a variety of ferroelectric domains with different polarization directions and switching behavior under an applied external electric field. The domain structure of PZT is highly dependent on its composition, thermal history, processing condition, and crystallographic orientation [15].…”

An Experimental Investigation on Polarization Process of a PZT-52 Tube Actuator with Interdigitated Electrodes

“…Piezoceramics are functional information materials that can convert mechanical energy and electrical energy into each other [ 1 , 2 ]. There are three properties: piezoelectricity, dielectricity and the elastic property.…”

Misfit-Strain Phase Diagram, Electromechanical and Electrocaloric Responses in Epitaxial PIN–PMN–PT Thin Films

“…Excellent performance is the key to the application of ferroelectric materials, which prompts people to continuously explore ferroelectric materials with an excellent performance [ 5 , 6 , 7 ]. Piezoelectric materials contain defects such as ferroelectric domains, oxygen vacancies, defect dipoles, and the strain [ 8 , 9 , 10 ]. PbMg 1/3 Nb 2/3 O 3 −PbTiO 3 (PMN–PT) can reach an ultrahigh piezoelectric response (d 33 > 2000 pC/N) and has electromechanical coupling factors (k 33 > 0.9) [ 11 ], which have attracted much attention [ 12 , 13 , 14 , 15 ].…”

“…It is known that the misfit strain can, in general, influence the phase structures and electromechanical properties in thin films [ 24 ]. The films have wider applications and a better adjustment than the bulks [ 8 ]. However, the influences of the misfit strain on the phase structures, electromechanical properties, and electrocaloric response in the epitaxial PIN–PMN–PT thin films have been lacking, which hinders the corresponding experimental studies.…”