2022
DOI: 10.1002/admi.202200206
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Mechanical Fatigue Resistance of Polydiketopyrrolo‐Pyrrole‐Dithienylthieno[3,2‐b]thiophene‐Based Flexible Field‐Effect Transistors

Abstract: Mechanical durability is one of the main obstacles of flexible organic electronic devices. In this work, the fatigue behavior of flexible field‐effect transistors based on a diketopyrrolo‐pyrrole‐dithienylthieno[3,2‐b]thiophene polymer is reported. An especially for that purpose designed bending setup allows to perform precise multiple deformation cycles of the transistor channel area while monitoring the device behavior. The transistors show high operational stability upon 100 bending cycles at a radius of 50… Show more

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Cited by 4 publications
(1 citation statement)
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“…However, the change in V th from 0 to 1000 cycles for device set B is not as drastic as the values in device set A, and therefore does not require a significant increase in source-drain bias voltage required to power the OFETs. Overall, the observed trend for device sets A and B aligns with previous literature for OFETs prepared on flexible polyethylene terephthalate (PET), showing that bending tensile deformation initially significantly decreases charge mobility, followed by a relative stabilization once cracks form. Notably, deformation perpendicular to the channel exerts a greater influence on charge transport than parallel deformation.…”
Section: Resultssupporting
confidence: 86%
“…However, the change in V th from 0 to 1000 cycles for device set B is not as drastic as the values in device set A, and therefore does not require a significant increase in source-drain bias voltage required to power the OFETs. Overall, the observed trend for device sets A and B aligns with previous literature for OFETs prepared on flexible polyethylene terephthalate (PET), showing that bending tensile deformation initially significantly decreases charge mobility, followed by a relative stabilization once cracks form. Notably, deformation perpendicular to the channel exerts a greater influence on charge transport than parallel deformation.…”
Section: Resultssupporting
confidence: 86%