2005
DOI: 10.1103/physrevb.72.035445
|View full text |Cite
|
Sign up to set email alerts
|

Mechanical properties of a carbon nanotube fixed at a tip apex: A frequency-modulated atomic force microscopy study

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

4
28
0
1

Year Published

2007
2007
2023
2023

Publication Types

Select...
5
2
1

Relationship

0
8

Authors

Journals

citations
Cited by 28 publications
(33 citation statements)
references
References 27 publications
4
28
0
1
Order By: Relevance
“…This expression is identical to the one obtained without using development in Fourier coecients [23,24]. Figure 5a shows the variation of the relative repulsive frequency shift as a function of the normalized distance for two CNT bending stiness k r .…”
Section: Vertical Forces Acting On the Nanotube In Intermittent Contactsupporting
confidence: 65%
See 1 more Smart Citation
“…This expression is identical to the one obtained without using development in Fourier coecients [23,24]. Figure 5a shows the variation of the relative repulsive frequency shift as a function of the normalized distance for two CNT bending stiness k r .…”
Section: Vertical Forces Acting On the Nanotube In Intermittent Contactsupporting
confidence: 65%
“…In contrary to the pure elastic case [23], the presence of the normalized distance δ in the attractive parts (table 1) 1. no interaction : rst the CNT does not interact with the surface, the resonance frequency is the oscillator free one, the frequency shift is null and no additional dissipation occurs.…”
Section: Amplitude Inuencementioning
confidence: 81%
“…The frictional response is well known to have a large contribution from the viscous character of the material being imaged (17,19). Some investigators have examined response functions by characterizing friction and/or wear under repeated scanning with variable loads (13,33), providing information on the viscoelastic and viscoplastic properties of a material.…”
mentioning
confidence: 99%
“…Table II summarizes the device dimensions and the measured spring constants. The values range between 3 to 70 N/m, which is significantly higher when compared to the spring constants of previously reported MWCNT devices [42,43,46]. The spring constant of the AFM tips used were about 100 N/m.…”
Section: Resultsmentioning
confidence: 71%
“…However, even with the spacing as low as 50 nm, the resistance due to the oversprayed film was in the MΩ range, which is significantly higher than the resistance of the CNTS, showing thus a negligible effect of Pt overspray on the measured resistance CNT devices. We characterized five devices for their mechanical properties using AFM imaging and FD measurements [42][43][44][45]. Fig.…”
Section: Resultsmentioning
confidence: 99%