“…31 As a result, in the last two decades the development of nano-manipulation techniques based on focus ion beam technology (FIB-SEM), 32 electron microscopy (EM), 33 the integration of micro-electro-mechanical systems (MEMS) into electron microscopes, 34,35 and atomic force microscopy (AFM), enabled the mechanical characterization of NWs on a new level. For instance, the AFM-based three-point bending test has been used for characterizing the elastic modulus of various NWs, including Ag, 36 Si, 37 Ge, 38 TiSi 2 , 39 NiC, 40 SiC, 41 SiO 2 , 42 ZnO, 43 and CuO 44 and metallic glasses. 45 Alternatively, the contact resonance method in an AFM, has also become a popular non-destructive method to measure the elastic properties of NWs, such as ZnO 33,46 oxidized Si 47 and Si.…”