2019
DOI: 10.1002/aic.16593
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Mechanics of the low‐flow limit in slot‐die coating with no vacuum

Abstract: Slot-die coating is a premetered, film-deposition process compatible with a wide range of materials. Of topical interest to precision electronics applications is the deposition of high-cost nanomaterial dispersions over moderately sized (>10 cm 2) areas with submicron wet film thickness. In this work, a two-dimensional (2D) model has been developed to understand the limits of the process and to predict the thinnest possible film achievable. Coined the low-flow limit, this parametric operating boundary presents… Show more

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Cited by 11 publications
(5 citation statements)
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“…The coating gap H = 161 μm was assumed to be constant because the diameter of the backup roller was much bigger than the computational domain. 16,21 h was the coating thickness.…”
Section: Numerical Modelingmentioning
confidence: 99%
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“…The coating gap H = 161 μm was assumed to be constant because the diameter of the backup roller was much bigger than the computational domain. 16,21 h was the coating thickness.…”
Section: Numerical Modelingmentioning
confidence: 99%
“…θ e was the contact angle between the slurry and the relative static substrate. 21 2.4. Numerical Solution.…”
Section: Boundary Conditionsmentioning
confidence: 99%
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“…These challenges demand faster, more uniform, and more reliable scalable manufacturing of ultrathin inorganic CTLs to accelerate the commercial viability of planar cell architectures optimized for long-term stability.This work develops a new scalable strategy based on highspeed flexography to meet the technological demand for fabricating ultrathin HTLs in planar inverted perovskite solar cells. Flexography is advantageous for rapid coating of ultrathin wet films of electronic inks without encountering the low-flow limit in slot die coating [20] or the limits of droplet-wise deposition in methods such as spray pyrolysis. [13] This is essential for inorganic hole transport layers (HTLs) that must be characteristically thin (5-50 nm) to achieve high PCE, [21] otherwise requiring expensive vacuum methods such as atomic layer deposition (ALD).…”
mentioning
confidence: 99%