Efficient charge separation at the interfaces between the perovskite and with the carrier transport layers is crucial for perovskite solar cells to achieve high power conversion efficiency. We systematically investigate the hole injection dynamics from MAPbI3 perovskite to three typical hole transport materials (HTMs) PEDOT:PSS, PTAA and NiOx by means of pump-probe transmission measurements. We photoexcite only near the MAPbI3/HTM interface or near the back surface, and measure the differential transient transmission between the two excitation configurations to extract the carrier dynamics directly related to the hole injection. The differential transmission signals directly monitor the hole injections to PTAA and PEDOT:PSS being complete within 1 and 2 ps, respectively, and that to NiOx exhibiting an additional slow process of 40 ps time scale. The obtained injection dynamics are discussed in comparison with the device performance of the solar cells containing the same MAPbI3/HTM interfaces.Lead halide perovskite photovoltatic cells have been developing rapidly in the past few years, with their power conversion efficiency (PCE) now exceeding 22% [1]. The perovskites are direct semiconductors, and their photovoltatics can in principle work as a model p-i-n diode [2]. The difficulty in the controlled impurity doping in the perovskites can be circumvented by sandwiching the perovskite film between thin layers of electron-and holetransporting materials (ETM and HTM) in the planar heterojunction structure [3]. These carrier transporting layers enable efficient and irreversible separation of the electrons and holes photoexcited in the perovskite, and thereby lead to the high PCE of the perovskite solar cells. Whereas various inorganic and organic materials have been explored as ETM and HTM based on their conduction band minimum (CBM) and valence band maximum (VBM) energies with respect to those of the perovskite, the actual device performance depends very weakly on the energy level offset [3,4] but can be significantly affected by other factors such as perovskite crystalline quality and interfacial defects [5,6].The charge separation dynamics can in principle be monitored directly by means of transient absorption (or transmission) measurements in the visible to teraherz ranges. The time scale of the charge injection from the perovskite to the HTM layer remain controversial despite the extensive previous studies [5][6][7][8][9][10][11][12][13][14], however. The time constant of the hole injection from CH3NH3PbI 3 (MAPbI 3 ) to spiro-OMeTAD in the previous reports, for example, scattered widely from <80 fs [7] to 0.7 ps [8,9] to 8 ps [10]. The hole injection to NiO x was reported to be complete on sub-picosecond time scale [11], whereas those * ishioka.kunie@nims.go.jp to poly(triarylamine) (PTAA), poly(3-hexylthiophee-2,5-diyl (P3HT), and poly [2,6-(4,4-bis(2-ethylhexyl)-4H-cyclopenta [2,1-b;3,4-b'] dithiophene)-alt-4,7-(2,1,3-benzothiadiazole) (PCPDTBT) were reported to occur on sub-nanosecond time scales [12]. The ...